The Journal of Korean Institute of Electromagnetic Engineering and Science (한국전자파학회논문지)

The Korean Institute of Electromagnetic Engineering and Science (한국전자파학회)
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Recent Trends in System-Level EMC Investigation and Countermeasure Technology for RF Interference Due to High-Speed Digital System Noise

고속 디지털 시스템 잡음에 의한 RF 시스템 간섭(RFI) 현상에 관한 시스템 레벨의 EMC 분석 및 대책 기술 연구 동향

  • Koo, Tae-Wan (Department of Electric and Electronic Engineering, Yonsei University) ;
  • Lee, Ho Seong (Department of Electric and Electronic Engineering, Yonsei University) ;
  • Yook, Jong-Gwan (Department of Electric and Electronic Engineering, Yonsei University)
  • 구태완 (연세대학교 전기전자공학과) ;
  • 이호성 (연세대학교 전기전자공학과) ;
  • 육종관 (연세대학교 전기전자공학과)
  • Received : 2014.08.11
  • Accepted : 2014.09.29
  • Published : 2014.10.31
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Abstract

This paper presents recent trends in system-level EMC investigation and countermeasure technology for radio frequency interference (RFI) influenced by noise generated in high-speed digital system. Recently, as the only digital device can perform various roles, there are a variety of EMI/EMC problems between systems. Especially, RFI is now recognized as a major problem, which occurs by EMI caused by the digital system. Therefore, in this paper, recent trends of RFI investigation from component-level to system-level are introduced and analyzed. Furthermore, in order to solve the RFI problem, recent researches are presented and investigated for the occurrences and suppression methods of common-mode noise which is one of the major noise sources in high-speed digital system. Lastly, this paper suggested future research of system-level EMC analysis and countermeasure technology for RFI problems.

본 논문에서는 고속 디지털 시스템에서 발생하는 잡음에 의해 RF 시스템의 특성이 열화되는 현상(RF interference: RFI)에 관한 시스템 레벨의 EMC 분석 기술과 주요 잡음원인 고속 디지털 시스템에서의 EMC 대책 기술을 소개하고 분석하였다. 현재 하나의 전자기기에서 시스템 간 발생하는 EMI/EMC 문제는 더욱 심각해지고 있으며, 특히 디지털 시스템의 EMI에 의한 RFI 문제는 주요 관심 문제로 인식되고 있다. 따라서 본 논문에서는 현재까지 연구되어진 부품 레벨부터 시스템 레벨까지의 RFI 연구에 대하여 소개하고 분석하였다. 그리고 이 문제를 해결하기 위해서 주요 잡음원 중의 하나인 고속 디지털 인터페이스에서 발생하는 공통모드 잡음의 발생 원인과 그에 대한 대책 연구에 관하여 분석하였다. 마지막으로, 앞으로 RFI 문제를 해결하기 위한 시스템 레벨의 EMC 분석 및 대책 연구방향을 제시하였다.

Keywords

Acknowledgement

Supported by : 한국연구재단

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