Journal of the Optical Society of Korea

  • 제18권5호
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  • Pages.594-597
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  • 2014
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  • 1226-4776(pISSN)
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  • 2093-6885(eISSN)
한국광학회 (Optical Society of Korea)
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Voltage-Dependent Residual Phase Noise of a Photodiode Measurement Based on a Two-Tone Correlation Method

  • Zhu, Dezhao (School of Electronic Science and Engineering, Southeast University) ;
  • Yang, Chun (School of Electronic Science and Engineering, Southeast University) ;
  • Cao, Zhewei (School of Electronic Science and Engineering, Southeast University) ;
  • Li, Xianghua (School of Electronic Science and Engineering, Southeast University)
  • 투고 : 2014.06.13
  • 심사 : 2014.08.05
  • 발행 : 2014.10.25
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초록

We propose a novel approach to measure the residual phase noise (RPN) of a photodiode (PD) based on a two-tone correlation method. Compared with the previous measurements of the RPNs of PDs, this method is more convenient in practical application. In this method, two microwave sources and other components were placed in two isolated links sharing the same PD, so the noises of them were uncorrelated. With an FFT analyzer, the uncorrelated noises could be mostly suppressed while only the RPN of the PD was preserved. Voltage-dependent nonlinearities of PDs were studied previously. In this letter, we investigate the relationship between the RPN of the PD and the bias voltage on the PD. By changing the bias voltage, the difference of the RPN can be up to 10 dB.

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참고문헌

  1. D. Kuhl, F. Hieronymi, E. H. Bottcher, T. Wolf, D. Bimberg, J. Kuhl, and M. Klingenstein, "Influence of space charges on the impulse response of InGaAs metal-semiconductormetal photodetectors," J. Lightwave Technol. 10, 753-759 (1992). https://doi.org/10.1109/50.143074
  2. R. R. Hayes and D. L. Persechini, "Nonlinearity of p-i-n photodetectors," IEEE Photon. Technol. Lett. 5, 70-72 (1993). https://doi.org/10.1109/68.185064
  3. K. J. Williams, R. D. Esman, and M. Dagenais, "Nonlinearities in p-i-n icrowave photodetectors," J. Lightwave Technol. 14, 84-96 (1996). https://doi.org/10.1109/50.476141
  4. A. S. Hastings, D. A. Tulchinsky, and K. J. Williams, "Photodetector nonlinearities due to voltage-dependent responsivity," IEEE Photon. Technol. Lett. 21, 1642-1644 (2009). https://doi.org/10.1109/LPT.2009.2031165
  5. W. Shieh and L. Maleki, "Phase noise characterization by carrier suppression techniques in RF photonic systems," IEEE Photon. Technol. Lett. 17, 474-476 (2005). https://doi.org/10.1109/LPT.2004.839781
  6. E. Rubiola, E. Salik, N. Yu, and L. Maleki, "Flicker noise in high-speed p-i-n photodiodes," IEEE Transactions on Microwave Theory and Techniques 54, 816-820 (2006). https://doi.org/10.1109/TMTT.2005.863062
  7. D. A. Tulchinsky and K. J. Williams, "Excess amplitude and excess phase noise of RF photodiodes operated in compression," IEEE Photon. Technol. Lett. 17, 654-656 (2005). https://doi.org/10.1109/LPT.2004.842398
  8. D. A. Tulchinsky and K. J. Williams, "Phase noise in compressed RF photodiodes," in Proc. the 2004 International Topical Meeting on Microwave Photonics (Ogunquit, ME, United States, Oct. 2004), pp. 269-272.
  9. E. Rubiola and V. Giordano, "Correlation-based phase noise measurements," Review of Scientific Instruments 71, 3085-3091 (2000). https://doi.org/10.1063/1.1304871
  10. E. Rubiola and F. Vernotte, "The cross-spectrum experimental method," arXiv:1003.0113 [physics.ins-det], Feb 27 (2010).