Implementation of Large Area CMOS Image Sensor Module using the Precision Align Inspection

정밀 정렬 검사를 이용한 대면적 CMOS 이미지 센서 모듈 구현

  • 김병욱 (전북테크노파크 방사선영상기술센터) ;
  • 김영주 (전북테크노파크 방사선영상기술센터) ;
  • 유철우 (전북테크노파크 방사선영상기술센터) ;
  • 김진수 ((주)나노솔텍) ;
  • 이경용 ((주)나노솔텍) ;
  • 김명수 (한국과학기술원 원자력 및 양자공학과) ;
  • 조규성 (한국과학기술원 원자력 및 양자공학과)
  • Received : 2014.12.05
  • Accepted : 2014.12.30
  • Published : 2014.12.31

Abstract

This paper describes a large area CMOS image sensor module Implementation using the precision align inspection program. This work is needed because wafer cutting system does not always have high precision. The program check more than 8 point of sensor edges and align sensors with moving table. The size of a $2{\times}1$ butted CMOS image sensor module which except for the size of PCB is $170mm{\times}170mm$. And the pixel size is $55{\mu}m{\times}55{\mu}m$ and the number of pixels is $3,072{\times}3,072$. The gap between the two CMOS image sensor module was arranged in less than one pixel size.

Keywords

Acknowledgement

Supported by : 전라북도, 미래창조과학기술부