Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
권호 표지
DOI QR코드

DOI QR Code

Analysis of the Bouncing Phenomenon due to the Deterioration of the Relay Contact

릴레이 접점 열화에 따른 바운싱 현상 분석

  • Ryu, Jae-Man (Department of Electrical Engineering, Inha University) ;
  • Choi, Sun-Ho (Department of Electrical Engineering, Inha University) ;
  • Park, Ki-Hoon (Department of Electrical Engineering, Inha University) ;
  • Huh, Chang-Su (Department of Electrical Engineering, Inha University)
  • Received : 2014.03.06
  • Accepted : 2014.03.17
  • Published : 2014.06.01
Download PDF
⟨ Previous Next ⟩

Abstract

The relay used is gradually increased. Because it is possible to easily control the high voltage and current. Bounce phenomenon is generated in contact during operation relay. As the result, arc is generated at the contact, thereby shortening the contact lifetime. In this study, we analyzed the bouncing phenomenon due to deterioration. It can be seen from the experimental results, and it is minimized at about 100,000 times. Bouncing phenomenon to increase again after the minimization. Consequently, the bouncing related to contact weight and shape of contact surface.

Keywords

References

  1. J. M. Ryu, S. H. Choi, and C. S. Huh, KIIEE, 27, 41 (2013).
  2. L. Morin, N. B. Jemaa, and D. Jeannot, IEEE T. Compon. Pack. T., 23, 240 (2000). https://doi.org/10.1109/6144.846760
  3. Y. K. Ko, S. S. Cho, H. Huh, S. Y. Lee, H. T. Park, and I. S. Oh, ISIE, 189 (2009).
  4. P. G. Slade, Electrical Contacts: Principles and Applications (Marcel Dekker, 1999) p. 735.
  5. C. Schrank, A. R. Neuhaus, and M. Reichart, Electrical Contact, 130 (2007).
  6. R. Holm, Electric Contacts Theory and Application (Springer, 1999)
  7. M. Braunovic, N. K. Myshkin, and V. V. Konchits, Electrical Contacts: Fundamentals, Applications and Technology (CRC Press, 2007)