전자공학회논문지 (Journal of the Institute of Electronics and Information Engineers)

  • 제51권5호
  • /
  • Pages.106-113
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  • 2014
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  • 2287-5026(pISSN)
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  • 2288-159X(eISSN)
대한전자공학회 (The Institute of Electronics and Information Engineers)
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Frequency-ordered 기반 FDR 테스트패턴 압축 알고리즘

FDR Test Compression Algorithm based on Frequency-ordered

  • 문창민 (한양대학교 컴퓨터공학과) ;
  • 김두영 (한양대학교 컴퓨터공학과) ;
  • 박성주 (한양대학교 컴퓨터공학과)
  • Mun, Changmin (Department of Computer Science & Engineering, Hanyang University) ;
  • Kim, Dooyoung (Department of Computer Science & Engineering, Hanyang University) ;
  • Park, Sungju (Department of Computer Science & Engineering, Hanyang University)
  • 투고 : 2013.10.21
  • 심사 : 2014.04.28
  • 발행 : 2014.05.25
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초록

최근 반도체 업계에서 주요 관심사로 떠오르고 있는 SOC(System-on-a-chip) 테스트는 비용 및 시간 절감을 위해 여러 종류의 FDR(Frequency-directed run-length) 기술이 제안되었다. 기존의 FDR보다 압축률을 향상시키는 EFDR(Extended-FDR)과 SAFDR(Shifted-Alternate-FDR), VPDFDR(Variable Prefix Dual-FDR)이 있다. 본 논문에서는 제안한 Frequency-ordered 방식은 FDR, EFDR, SAFDR, VPDFDR에 적용시켜 상당한 압축률 개선을 보인다. 본 기술을 사용하면 압축률을 극대화할 수 있고, 결과적으로 전체적인 양산 테스트 비용 및 시간을 크게 절감할 수 있게 한다.

Recently, to reduce test cost by efficiently compressing test patterns for SOCs(System-on-a-chip), different compression techniques have been proposed including the FDR(Frequency-directed run-length) algorithm. FDR is extended to EFDR(Extended-FDR), SAFDR(Shifted-Alternate-FDR) and VPDFDR(Variable Prefix Dual-FDR) to improve the compression ratio. In this paper, a frequency-ordered modification is proposed to further augment the compression ratios of FDR, EFDR, SAFRD and VPDFDR. The compression ratio can be maximized by using frequency-ordered method and consequently the overall manufacturing test cost and time can be reduced significantly.

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참고문헌

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