Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)

The Korean Society Of Semiconductor & Display Technology (한국반도체디스플레이기술학회)
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3D Surface Reconstruction by Combining Focus Measures through Genetic Algorithm

유전 알고리즘 기반의 초점 측도 조합을 이용한 3차원 표면 재구성 기법

  • Mahmood, Muhammad Tariq (Korea University of Technology and Education, School of Computer Science and Engineering) ;
  • Choi, Young Kyu (Korea University of Technology and Education, School of Computer Science and Engineering)
  • Received : 2014.05.27
  • Accepted : 2014.06.20
  • Published : 2014.06.30
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Abstract

For the reconstruction of three-dimensional (3D) shape of microscopic objects through shape from focus (SFF) methods, usually a single focus measure operator is employed. However, it is difficult to compute accurate depth map using a single focus measure due to different textures, light conditions and arbitrary object surfaces. Moreover, real images with diverse types of illuminations and contrasts lead to the erroneous depth map estimation through a single focus measure. In order to get better focus measurements and depth map, we have combined focus measure operators by using genetic algorithm. The resultant focus measure is obtained by weighted sum of the output of various focus measure operators. Optimal weights are obtained using genetic algorithm. Finally, depth map is obtained from the refined focus volume. The performance of the developed method is then evaluated by using both the synthetic and real world image sequences. The experimental results show that the proposed method is more effective in computing accurate depth maps as compared to the existing SFF methods.

Keywords

References

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