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An Analysis on the Performance of the Close-In-Weapon-System Using Absorbing Markov Chains

흡수 마코프체인을 활용한 함정 근접무기체계 효과성 분석

  • Kim, Seong-Woo (Graduate School of Defense Management, Korea National Defense University) ;
  • Yoon, Bong-Kyoo (Graduate School of Defense Management, Korea National Defense University)
  • Received : 2014.03.03
  • Accepted : 2014.10.17
  • Published : 2014.12.05

Abstract

Since the technology of anti-ship missiles has advanced rapidly, defending battleships from the threat of anti-ship missiles is a crucial factor for the survival of warships. In this paper, we analyze the performance of an anti-ship missile defense system whose name is Close-In-Weapon-System. We show the survival probability of a warship equipped with the Close-In-Weapon-System as the number of anti-ship missiles attacking the warship varies. Because of the complex and dynamic operational characteristics surrounding the Close-In-Weapon-System such as speed of missiles, different range of an individual weapon in the weapon system, and the continuous change of the kill probability of the missiles corresponding to the distance of missiles from ships, few work has been done for the performance of Close-In-Weapon-System. We present a model to incorporate all the dynamic characteristics of the system using absorbing Markov Chain. With our results, we expect commanders of warships equipped with Close-In-Weapon-System to be provided with more helpful information on how to deal with the anti-ship missiles.

Keywords

References

  1. K. S. Kim, "A Study on the Procedure to Assess the Vulnerability of Warship," In Hwa University, 2011.
  2. B. R. Kim, "A methodology Study of Rotorcraft's Survivability Analysis," Kyung Sang University, 2008.
  3. I. D. Kim and S. T. Ha, "Aircraft Combat Survivability Analysis Model for the Air-to-Ground Mission," The Korean Institute of Industrial Engineers, Vol. 1998, No. 10, pp. 924-931, 1998.
  4. Y. Kim and B. K. Yoon, "Analysis on the Determination of Machine Repair Problem Maintenance Floats with Divided Repair Time Through Absorbing Markov Chain," Korea Management Operation Research, Vol. 34, No. 2, pp. 1-16, 1998.
  5. H. R. Kim, "Survivability Evaluation Model for Network Information Services on Mobile Internet," Dae Jeon University, 2007.
  6. Y. S. Son, S. W. Kim and B. K. Yoon, "A Study on the Criteria to Decide the Number of Aircrafts Considering Operational Characteristics," Journal of the Kora Institute of Military Science and Technology, Vol. 17, No. 1, pp. 41-49, 2014. https://doi.org/10.9766/KIMST.2014.17.1.041
  7. B. K. Yoon and K. H. Cha, "Analysis on the Optimal Spare Level for Army Aviation's Avionics through Capacity Pooling," Korean Journal of Logistics, Vol. 16, No. 1, pp. 1-17, 2008.
  8. B. K. Yoon, "Markovian Arrival Process and its Application in Defense Area, Research for National Security Affairs," 2010.
  9. Arnold, R. J., "Survivability Design of Forward Air Combat and Light Attack Aircraft," National Aeronautics and Space Engineering and Manufacturing Meeting, Society of Automotive Engineers, Inc., SAE Paper 690707, pp. 1-11, Oct. 1969.
  10. Atkinson, D. D., "Aircraft Survivability," The Shock and Vibration, No. 53, Part 1, May 1983.
  11. Ball, R. E., The Fundamentals of Aircraft Combat Survivability Analysis and Design, New York, American Institute of Aeronautics Astronautics, Inc., New York, NY, 1985.
  12. Ball, R. E. and Calvano, "Establishing the Fundamentals of a Surface Ship Survivability Design Discipline," Naval Engineers Journal, Vol. 1, pp. 71-74, 1994.
  13. Graham, D. and Clement, W. F., "An Engineering Approach to Aircraft Survivability Enhancement Analysis," Engineering Optimization, Vol. 2, pp. 35-45, 1976. https://doi.org/10.1080/03052157608960595
  14. Lillis and Calvano, "Analysis of the Applicability of Aircraft Vulnerability Assessment and Reduction Techiques to Small Surface Craft," Naval Postgraduate School, 2012.
  15. "MIL-STD-721B : Definition of Effectiveness Terms for Reliability, Maintainability, Human Actors, and Safety," Micro-electronics and Reliability, Vol. 11, pp. 429-433, 1972. https://doi.org/10.1016/0026-2714(72)90476-3