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Analysis of Failure in Miniature X-ray Tubes with Gated Carbon Nanotube Field Emitters

  • Kang, Jun-Tae (Creative Future Research Laboratory, ETRI, Department of Physics, Kyungpook National University) ;
  • Kim, Jae-Woo (Creative Future Research Laboratory, ETRI, School of Advanced Device Engineering, UST) ;
  • Jeong, Jin-Woo (Creative Future Research Laboratory, ETRI) ;
  • Choi, Sungyoul (Creative Future Research Laboratory, ETRI) ;
  • Choi, Jeongyong (Creative Future Research Laboratory, ETRI) ;
  • Ahn, Seungjoon (Creative Future Research Laboratory, ETRI, Department of Information Display, Sun Moon University) ;
  • Song, Yoon-Ho (Creative Future Research Laboratory, ETRI, School of Advanced Device Engineering, UST)
  • Received : 2013.07.16
  • Accepted : 2013.08.21
  • Published : 2013.12.31
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Abstract

We correlate the failure in miniature X-ray tubes with the field emission gate leakage current of gated carbon nanotube emitters. The miniature X-ray tube, even with a small gate leakage current, exhibits an induced voltage on the gate electrode by the anode bias voltage, resulting in a very unstable operation and finally a failure. The induced gate voltage is apparently caused by charging at the insulating spacer of the miniature X-ray tube through the gate leakage current of the field emission. The gate leakage current could be a criterion for the successful fabrication of miniature X-ray tubes.

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References

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