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태양광 발전시스템의 신뢰성 향상을 위한 태양전지의 PID 저감 기술의 타당성 검토

A Study on Validity of Anti-PID Technology of Solar Cell for the High Reliability of Photovoltaics System

  • Baik, Sungsun (School of Industrial Engineering, Kumoh National Institute of Technology) ;
  • Baek, Seungyup (STX Solar Co. Ltd.) ;
  • Jung, Tae-Wook (Department of consulting, Graduate School Kumoh National Institute of Technology) ;
  • Cho, Jin-Hyng (School of Industrial Engineering, Kumoh National Institute of Technology)
  • 투고 : 2013.04.25
  • 심사 : 2013.05.02
  • 발행 : 2013.06.30

초록

In recent years, anti-PID (Potential Induced Degradation) technologies have been studied and developed at various stages throughout the solar value chain from solar cells to systems in an effort to enhance long-term reliability of the photovoltaics (PV) system. Such technologies and applications must bring in profits economically for both manufacturers of solar cell/module and investors of PV systems, simultaneously for the development of the PV industry. In this study two selected anti-PID technologies, ES (modification of emitter structure) and ARC (modification of anti-reflective coating) were compared based on the economic features of both a cell maker with 60MW production capacity and an investor of 1MW PV power plant. As a result of this study, it is shown that ARC anti-PID technology can ensure more profits over ES technology for both the cell manufacturer and the investor of PV power plant.

키워드

참고문헌

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피인용 문헌

  1. 결정질 실리콘 태양광발전모듈 인증 실적의 시계열 분석 vol.37, pp.3, 2013, https://doi.org/10.7836/kses.2017.37.3.033
  2. PERC 태양전지에서 반사방지막과 p-n 접합 사이에 삽입된 SiOx 층의 두께가 Potential-Induced Degradation (PID) 저감에 미치는 영향 vol.26, pp.3, 2013, https://doi.org/10.6117/kmeps.2019.26.3.075