References
- A. Surca, B. Orel, B. Pihlar and P. Bukovec, J. Electroanal. Chem., 408, 83 (1996) https://doi.org/10.1016/0022-0728(96)04509-3
- P. D. Vidts, J. Delgado, B. Wu, D. See, K. Kosanovich and R. E. White, J. Electrochem. Soc., 145, 3874 (1998) https://doi.org/10.1149/1.1838887
- J. S. Do and T. C. Chou, J. Appl. Electrochem., 22, 966 (1992) https://doi.org/10.1007/BF01024145
- J. S. Do and T. C. Chou, J. Appl. Electrochem., 20, 978 (1990) https://doi.org/10.1007/BF01019575
- Y. L. Chen and T. C. Chou, Ind. Eng. Chem. Res., 35, 2172 (1996) https://doi.org/10.1021/ie950502z
- R. Kostechi and F. Mclarnon, J. Electrochem. Soc., 144, 485 (1997) https://doi.org/10.1149/1.1837437
- K. W. Park, J. H. Choi, B. K. Kwon, S. A. Lee and Y. E. Sung, J. Phys. Chem. B, 106, 1869 (2002) https://doi.org/10.1021/jp013168v
- O. Yamamoto, Y. Takeda, R. Kanno and M. Noda, Solid State Ion., 22, 241 (1987). https://doi.org/10.1016/0167-2738(87)90039-7
- N. Dharmaraj, H. C. Park, C. K. Kim, H. Y. Kim and D. R. Lee, Mater. Chem. and Phys., 87, 5 (2004). https://doi.org/10.1016/j.matchemphys.2004.05.005
- M. S. Sadjadi, K. Zare, S. Khanahmadzadeh and M. Enhessari, Mater. Lett., 62, 3679 (2008). https://doi.org/10.1016/j.matlet.2008.04.028
- Y. Shimizu, K. Uemura, N. Miura and N. Yamzoe, Chem. Lett., 67, 1979 (1988).
- H. Obayashi, Y. Sakurai and T. Gejo, J. Solid State Chem., 17, 299 (1976). https://doi.org/10.1016/0022-4596(76)90135-3
- R. S. Singh, T. H. Ansari, R. A. Singh and B. M. Wanklyn, Mater. Chem. Phys., 50, 173 (1995).
- D. J. Taylor, P. F. Fleg and R. A. Page, Thin Solid Films, 408, 104 (2002). https://doi.org/10.1016/S0040-6090(02)00143-8
- A. Vadivel Murughan, Violet Samuel, S. C. Navale and V. Ravi, Mater. Lett., 60, 1791 (2006). https://doi.org/10.1016/j.matlet.2005.12.023
- M. Lerch, H. Boysen, R. Nerder, F. Frey and W. Laqua, J. Phys. Chem. Solids, 53, 1153 (1992). https://doi.org/10.1016/0022-3697(92)90032-9
- C. Marcilly, P. Courty and B. J. Delmon, J. Am. Ceram. Soc., 53, 56 (1970). https://doi.org/10.1111/j.1151-2916.1970.tb12003.x
- R. A. Page, C. R. Blanchard-Ardid and W. Wei, J. Mater. Sci., 23, 946 (1988). https://doi.org/10.1007/BF01153994