A Study on the Residual Stress Analysis of a-Si Thin Film Solar Cell

a-Si 박막형 태양전지의 잔류응력 해석에 관한 연구

  • Hur, Jang-Wook (Intelligent Mechanical Engineering, Kumoh Institute of Technology) ;
  • Kim, Dong-Wook (Graduate School of Intelligent Mechanical Engineering, Kumoh Institute of Technology) ;
  • Choi, Sung-Dae (Intelligent Mechanical Engineering, Kumoh Institute of Technology)
  • Published : 2013.04.30

Abstract

The size and distribution of residual stresses and the effect of the minimum mesh size were investigated by the a-Si thin film solar cell. Attributed to the difference in coefficient of thermal expansion of the a-Si and Ag concentrated residual stresses at the joint interface of dissimilar materials. The ${\sigma}y$ and ${\tau}xy$ didn't appear in the central part, but ${\sigma}x$ existed. However, ${\sigma}x$, ${\sigma}y$ and ${\tau}xy$ appeared in the edge part and concentrated residual stresses at the interface between a-Si and Ag. Minimum mesh size gets smaller, the concentration of ${\sigma}y$ was significantly and existence area was reduced. As a result, the failure of thin film solar cells during the cutting process can be explained by the residual stresses.

Keywords

References

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