References
- Bunn, C. W. Proc. Phys. Soc. London 1935, 47, 835. https://doi.org/10.1088/0959-5309/47/5/307
- Gudiksen, M. S.; Lauhon, L. J.; Smith, D. C.; Lieber, C. M. Nature 2002, 415, 617. https://doi.org/10.1038/415617a
- Haung, Y.; Daun, X. F.; Cui, Y.; Lauhon, L. J.; Kim, K. H.; Libber, C. M. Science 2001, 294, 1313. https://doi.org/10.1126/science.1066192
- Wagner, R. S.; Eliss, W. C. Appl. Phys. Lett. 1964, 4, 89. https://doi.org/10.1063/1.1753975
- Lee, W.; Jeong, M. C.; Myoung, J. M. Nanotechnology 2004, 15,144.
- Drici1, A.; Djeteli, G.; Tchangbedji, G.; Derouiche, H.; Jondo, K.; Napo, K.; Bernede, J. C.; Ouro-Djobo, S.; Gbagba, M. Phys. Stat. Sol. (A) 2004, 201, 1528. https://doi.org/10.1002/pssa.200306806
- Vergeis, M. A.; Mifsud, A.; Serna, C. J. J. Chem. Soc. Fara. Transac. 1990, 86, 959. https://doi.org/10.1039/ft9908600959
- Ko, H. J.; Chen, Y. F.; Zhu, Z.; Yao, T.; Kobayashi, I.; Uchiki, H. Appl. Phys. Lett. 2000, 76, 1905. https://doi.org/10.1063/1.126207
- Ohtomo, A.; Tamura, K.; Saikusa, K.; Takahashi, T.; Makino, T.; Segawa, Y.; Koinuma, H.; Kawasaki, M. Appl. Phys. Lett. 1999, 75, 2635. https://doi.org/10.1063/1.125102
- Zhang, W. H.; Shi, J. L.; Wang, L. Z.; Yan, D. S. Chem. Mater. 2000, 12, 1408. https://doi.org/10.1021/cm990740a
- Li, Y.; Meng, G. W.; Zhang, L. D.; Phillipp, F. F. Appl. Phys. Lett. 2000, 76, 2011. https://doi.org/10.1063/1.126238
- Look, D. C. J. Electron. Mater. 2006, 35, 1299. https://doi.org/10.1007/s11664-006-0258-y
- Ahsanulhaq, Q.; Umar, A.; Hahn, Y. B. Nanotechnology 2007, 18, 115603. https://doi.org/10.1088/0957-4484/18/11/115603
- Xu, D.; Guo, G.; Gui, L.; Tang, Y.; Shi, Z.; Jin, Z.; Gu, Z.; Liu, W.; Li, X.; Zhang, G. Appl. Phys. Lett. 1999, 75, 481. https://doi.org/10.1063/1.124415
- Sohn, J. I.; Lee, S.; Song, Y.-H.; Choi, S.-Y.; Cho, K.-I.; Nam, K.- S. Appl. Phys. Lett. 2001, 78, 901. https://doi.org/10.1063/1.1335846
- Li, J.; Lei, W.; Zhang, X.; Wang, B.; Ba, L. Solid State Electron. 2004, 48, 2147. https://doi.org/10.1016/j.sse.2004.06.011
- Ahsanulhaq, Q.; Umar, A.; Hahn, Y. B. Nanotechnology 2007, 18, 115603. https://doi.org/10.1088/0957-4484/18/11/115603
- Ieki, H.; Tanaka, H.; Koike, J.; Nishikawa, T. IEEE MTT-S Dig. 1996, 409.
- Ondo-Ndong, R.; Pascal-Delannoy, F.; Boyer, A.; Giani A.; Foucaran, A. Material Science and Engineering: B 2003, 97, 68. https://doi.org/10.1016/S0921-5107(02)00406-3
- Fragalà, M. E.; Mauro, A. D.; Litrico, G.; Grassia, F.; Malandrino, G.; Foti, G. Cryst. Eng. Comm. 2009, 11, 2770. https://doi.org/10.1039/b914541a
- Sriparna, C.; Smita, G.; Avesh, K. T.; Pushan, A. J. Nanosci. Nanotechnol. 2011, 11, 10379. https://doi.org/10.1166/jnn.2011.5197
- Caglar, M.; Ilican, S.; Caglar, Y. Thin Solid Films. 2009, 517, 5023. https://doi.org/10.1016/j.tsf.2009.03.037
- Wu, X. L.; Siu, G. G.; Fu, C. L.; Ong, H. C. Appl. Phys. Lett. 2001, 78, 2285. https://doi.org/10.1063/1.1361288
- Umar, A.; Karunagaran, B.; Suh, E. K.; Hahn, Y. B. Nanotechnology 2006, 17, 4072. https://doi.org/10.1088/0957-4484/17/16/013
- Dai, L.; Chen, X. L.; Wang, W. J.; Zhou, T.; Hu, B. Q. J. Phys.: Condens. Matter 2003, 15, 2221. https://doi.org/10.1088/0953-8984/15/13/308
- Vanheusden, K.; Seager, C. H.; Warren, W. L.; Tallant D. R.; Voigt, J. A. J. Appl. Phys. 1996, 79, 7938.
- Fang, X.; Li, J.; Zhao, D.; Shen, D.; Li, B.; Wang, X. J. Phys. Chem. C 2009, 113, 21208. https://doi.org/10.1021/jp906175x
- Dimova-Malinovska, D.; Nikolaeva, M. Vacuum 2003, 69, 227.
- Li, L.; Fang, X. S.; Chew, H. G.; Zheng, F.; Liew, T. H.; Xu, X. J.; Zhang, Y. X.; Pan, S. S.; Li, G. H.; Zhang, L. D. Adv. Funct. Mater. 2008, 18, 1080. https://doi.org/10.1002/adfm.200701051
- Pan, H.; Zhu, Y.; Sun, H.; Feng, Y.; Sow, C. H.; Lin, J. Nanotechnology 2006, 17, 5096. https://doi.org/10.1088/0957-4484/17/20/009
- Hong, W. K.; Sohn, J. I.; Song, S.; Lee, T. Nano Lett. 2008, 8, 950. https://doi.org/10.1021/nl0731116
Cited by
- Growth of Zinc Oxide Nanostructures on Electrochemically-Etched p-Type Silicon(100) Substrate by Chemical Bath Deposition Method vol.548-549, pp.1662-7482, 2014, https://doi.org/10.4028/www.scientific.net/AMM.548-549.358
- Application of porous silicon microcavity to enhance photoluminescence of ZnO/PS nanocomposites in UV light emission vol.130, pp.None, 2017, https://doi.org/10.1016/j.ijleo.2016.11.131