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A Parallel Mode Confocal System using a Micro-Lens and Pinhole Array in a Dual Microscope Configuration

이중 현미경 구조를 이용한 마이크로 렌즈 및 핀홀 어레이 기반 병렬 공초점 시스템

  • Bae, Sang Woo (School of Electronics Engineering, Kyungpook National University) ;
  • Kim, Min Young (School of Electronics Engineering, Kyungpook National University) ;
  • Ko, Kuk Won (Department of Information and Communication Engineering, Sunmoon University) ;
  • Koh, Kyung Chul (Department of Information and Communication Engineering, Sunmoon University)
  • Received : 2013.08.20
  • Accepted : 2013.10.04
  • Published : 2013.11.01

Abstract

The three-dimensional measurement method of confocal systems is a spot scanning method which has a high resolution and good illumination efficiency. However, conventional confocal systems had a weak point in that it has to perform XY axis scanning to achieve FOV (Field of View) vision through spot scanning. There are some methods to improve this problem involving the use of a galvano mirror [1], pin-hole array, etc. Therefore, in this paper we propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array in a dual microscope configuration. We made an area scan possible by using a combination MLA (Micro Lens Array) and pin-hole array, and used an objective lens to improve the light transmittance and signal-to-noise ratio. Additionally, we made it possible to change the objective lens so that it is possible to select a lens considering the reflection characteristic of the measuring object and proper magnification. We did an experiment using 5X, 2.3X objective lens, and did a calibration of height using a VLSI calibration target.

Keywords

References

  1. S. Kim, Y. Choi, J. Oh, and M. Jung, "Phase-shifting grating projection moire topography," Transactions of the Korean Society of mechanical engineers (in Korean), vol. 22, no. 4, pp. 850-857, 1998.
  2. K. Ko, K. Koh, and J. Kim, "Pole height inspection on LCD glass via high speed white light interferometry," Journal of the Korean Society of Precision Engineering (in Korean), vol. 24, no. 4, pp. 21-28, 2007.
  3. J. Kim, S. Han, K. Ko, and K. Koh, "Development of 3-D inspection technology for solder paste using PMP method," Journal of the Korean Society of Precision Engineering (in Korean), vol. 20, no. 10, pp. 12-21, 2003.
  4. S. Yi, J. Rhi, S. Kim, and J. Lee, "3D Acquisition by using multiview X-ray images," Journal of Institute of Control, Robotics and Systems, vol. 19, no. 10, pp. 886-890, 2013. https://doi.org/10.5302/J.ICROS.2013.13.8006
  5. C. Park and D. Kim, "Obstacle detection for generating the motion of humanoid robot," Journal of Institute of Control, Robotics and Systems (in Korean), vol. 18, no. 12, pp. 1115- 1121, 2012. https://doi.org/10.5302/J.ICROS.2012.18.12.1115
  6. Y. S. Bae, S. Moon, and D. Y. Kim, "High-speed image acquisition synchronized with the motion of galvanometer scanner for Confocal microscopy," Proc. SPIE Three- Dimensional and Multidmensional Microscopy, vol. 6861, pp. 686116.1-686116.8, 2008.
  7. G. Q. Xiao and G. S. Kino, "The real-time confocal scanning optical microscopy," Applied Physics Letters, vol. 53, no 8, pp. 716, 1988. https://doi.org/10.1063/1.99814
  8. M. Ishihara and H. Sasaki, "High-speed surface measurement using a nonscanning multiple-beam confocal microscope," Optical Engineering, vol. 38, no. 6, pp. 1035-1040, 1999. https://doi.org/10.1117/1.602155
  9. J. Pawley, Handbook of Biological Confocal Microscopy, Springer, 2006.
  10. http://ko.wikipedia.org/wiki/CUDA
  11. H. Choi, E. Park, and J. Kim, "Development of high-speed image interpolation method using CUDA," Proc. 2008 Conference on Information and Control Systems (in Korean), pp. 300-301, 2008.
  12. Y. Jung, CUDA Parallel Programming (in Korean), Freelec, 2011.

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