Journal of electromagnetic engineering and science

The Korean Institute of Electromagnetic Engineering and Science (한국전자파학회)
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Estimation of Transferred Power from a Noise Source to an IC with Forwarded Power Characteristics

  • Pu, Bo (Department of Electrical & Electronic Engineering, Sungkyunkwan University) ;
  • Kim, Taeho (Department of Electrical & Electronic Engineering, Sungkyunkwan University) ;
  • Kim, SungJun (Department of Electrical & Electronic Engineering, Sungkyunkwan University) ;
  • Kim, Jong-Hyeon (Department of Electrical & Electronic Engineering, Sungkyunkwan University) ;
  • Kim, SoYoung (Department of Semiconductor System Engineering, Sungkyunkwan University) ;
  • Nah, Wansoo (Department of Electrical & Electronic Engineering, Sungkyunkwan University)
  • Received : 2013.10.25
  • Accepted : 2013.12.03
  • Published : 2013.12.31
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Abstract

This paper proposes an accurate approach for predicting transferred power from a noise source to integrated circuits based on the characteristics of the power transfer network. A power delivery trace on a package and a printed circuit board are designed to transmit power from an external source to integrated circuits. The power is demonstrated between an injection terminal on the edge of the printed circuit board and integrated circuits, and the power transfer function of the power distribution network is derived. A two-tier calibration is applied to the test, and scattering parameters of the network are measured for the calculation of the power transfer function. After testing to obtain the indispensable parameters, the real received and tolerable power of the integrated circuits can be easily achieved. Our proposed estimation method is an enhancement of the existing the International Electrotechnical Commission standard for precise prediction of the electromagnetic immunity of integrated circuits.

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References

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