JSTS:Journal of Semiconductor Technology and Science

The Institute of Electronics and Information Engineers (대한전자공학회)
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Measurement of Multi-Port S-Parameters using Four-Port Network Analyzer

  • Kim, Jongmin (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Luong, Duc Long (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Nah, Wansoo (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University) ;
  • Kim, SoYoung (Department of Semiconductor Systems Engineering, College of Information and Communication Engineering, Sungkyunkwan University)
  • Received : 2013.03.14
  • Accepted : 2013.10.10
  • Published : 2013.12.31
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Abstract

An efficient measurement methodology is proposed to construct the scattering parameters of a multi-port device using a four-port vector network analyzer (VNA) without the external un-terminated ports. By using the four-port VNA, the reflected waves from the un-terminated ports could be minimized. The proposed method significantly enhances the accuracy of the S-parameters with less number of measurements compared to the results of classical renormalization technique which uses two-port VNA. The proposed method is validated from the measured data with the coupled 8-port micro-strip lines.

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References

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