DOI QR코드

DOI QR Code

Accurate Non-Quasi-Static Gate-Source Impedance Model of RF MOSFETs

  • Lee, Hyun-Jun (Department of Electronic Engineering, Hankuk University of Foreign Studies) ;
  • Lee, Seonghearn (Department of Electronic Engineering, Hankuk University of Foreign Studies)
  • Received : 2013.05.10
  • Accepted : 2013.10.05
  • Published : 2013.12.31

Abstract

An improved non-quasi-static gate-source impedance model including a parallel RC block for short-channel MOSFETs is developed to simulate RF MOSFET input characteristics accurately in the wide range of high frequency. The non-quasi-static model parameters are accurately determined using the physical input equivalent circuit. This improved model results in much better agreements between the measured and modelled input impedance than a simple one with a non-quasi-static resistance up to 40GHz, verifying its accuracy.

Keywords

References

  1. Y. Tsividis, Operation and Modeling of the MOS Transistor, 2nd ed. New York: Oxford Univ. Press, 1999.
  2. X. Jin, K. Cao, J.-J. Ou, W. Liu, Y. Cheng, M. Matloubian, and C. Hu, "An accurate nonquasistatic MOSFET model for simulation of RF high speed circuits," Proc. 2000 Symp. VLSI Technol. Dig. Tech. Papers, June 2000.
  3. M. Chan., K.Y. Hui, C. Hu, and P.K. Ko, "A robust and physical BSIM3 non-quasi-static transient and AC small-signal model for circuit simulation," IEEE Trans. Electron Devices, vol. 45, no. 4, pp. 834-841, 1998. https://doi.org/10.1109/16.662788
  4. M. Bagheri and Y. Tsividis, "A small-signal DC-tohigh- frequency nonquasistatic model for the fourterminal MOSFET valid in all regions of operation," IEEE Trans. Electron Devices, vol. ED- 32, no. 11, pp. 2383-2391, 1985.
  5. P. J. V. Vandeloo, W. M. C. Sansen, "Modeling of the MOS transistor for high frequency analog design," IEEE Trans Computer-Aided Design, vol. 8, no. 7, pp. 713-723, 1989. https://doi.org/10.1109/43.31528
  6. C. E. Biber, M. L. Schmatz, T. Morf, U. Lott, W. Bachtold, "A nonlinear microwave MOSFET model for Spice simulators," IEEE Trans. Microwave Theory Tech., vol. 46, no. 5, pp. 604- 610, 1998. https://doi.org/10.1109/22.668670
  7. J. P. Raskin, R. Gillon, J. Chen, D. Vanhoenacker- Janvier, J.-P. Colinge, "Accurate SOI MOSFET characterization at microwave frequencies for device performance optimization and analog modeling," IEEE Trans Electron Devices, vol. 45, no. 5, pp. 1017-1025, 1998. https://doi.org/10.1109/16.669514
  8. S. Lee and H. K. Yu, "Determining non-quasistatic small-signal equivalent circuit of a RF silicon MOSFET," Solid State Electronics, vol. 45, pp. 359-364, 2001. https://doi.org/10.1016/S0038-1101(01)00006-5
  9. I. M. Kang and H. Shin, "Non-quasi-static smallsignal modeling and analytical parameter extraction of SOI FinFETs", IEEE Transaction on Nanotechnology, vol. 5, no. 3, pp. 205-210, 2006. https://doi.org/10.1109/TNANO.2006.869946
  10. I. M. Kang, "Non-quasi-static RF model for SOI FinFET and its verification," Journal of Semiconductor Technology and Science, vol. 10, no. 2, pp.160-164, 2010. https://doi.org/10.5573/JSTS.2010.10.2.160
  11. H.-J. Lee and S. Lee, "A new extraction method for non-quasi-static gate resistance of RF MOSFETs," Electron. Lett, vol. 48, no. 23, pp. 1501-1503, 2012. https://doi.org/10.1049/el.2012.3135
  12. J.-Y. Kim, M.-K. Choi, and S. Lee, "A "thru-shortopen" de-embedding method for accurate on-wafer RF measurements of nano-scale MOSFETs," Journal of Semiconductor Technology and Science, vol. 12, no. 1, pp.53-58, 2012. https://doi.org/10.5573/JSTS.2012.12.1.53
  13. S. Lee, "Direct extraction technique for a smallsignal MOSFET equivalent circuit with substrate parameters," Microw. Opt. Technol. Lett, vol. 39, no. 4, pp. 344-347, 2003. https://doi.org/10.1002/mop.11210
  14. J.-Y. Kim, M.-K. Choi, and S. Lee, "Accuracy analysis of extraction methods for effective channel length in deep-submicron MOSFETs," Journal of Semiconductor Technology and Science, vol. 11, no. 2, pp. 129-132, 2011.

Cited by

  1. Accurate Extraction of Effective Gate Resistance in RF MOSFET vol.06, pp.05, 2015, https://doi.org/10.4236/cs.2015.65015
  2. -Parameter in Multi-Finger MOSFETs vol.53, pp.12, 2016, https://doi.org/10.5573/ieie.2016.53.12.015