한국고분자학회지:고분자과학과기술 (Polymer Science and Technology)
- 제24권5호
- /
- Pages.528-534
- /
- 2013
- /
- 1225-0260(pISSN)
- /
- 2586-1476(eISSN)
비행시간형 이차이온질량분석(TOF-SIMS) 장비를 이용한 고분자 표면분석 및 최근동향
Characterization of Polymer Surfaces by Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)
-
Lee, Yeonhee
(Advanced Analysis Center, Korea Institute of Science and Technology)
;
- Lee, Jihye (Advanced Analysis Center, Korea Institute of Science and Technology)
- 발행 : 2013.10.25