Journal of the Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회논문지)

The Korean Institute of Electrical and Electronic Material Engineers (한국전기전자재료학회)
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Pixel FPN Characteristics with Color-Filter and Microlens in Small Pixel Generation of CMOS Image Sensor

Color-Filter 및 Microlens를 포함한 CMOS Image Sensor의 Optical Stack 구조 별 Pixel FPN 특성 및 원인 분류

  • Choi, Woonil (Department of Electronic Engineering, Chungnam National University) ;
  • Lee, Hi-Deok (Department of Electronic Engineering, Chungnam National University)
  • 최운일 (충남대학교 전자전파정보통신공학과) ;
  • 이희덕 (충남대학교 전자전파정보통신공학과)
  • Received : 2012.09.28
  • Accepted : 2012.10.26
  • Published : 2012.11.01
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Abstract

FPN (fixed-pattern-noise) mainly comes from the device or pattern mismatches in pixel and color filter, pixel photodiode leakage in CMOS image sensor. In this paper, optical stack module related pixel FPN was investigated and the classification of pixel FPN contribution with the individual optical module process was presented. The methodology and procedure would be helpful in reducing the greater pixel FPN and distinguishing the complex FPN sources with respect to various noise factors.

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References

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