DOI QR코드

DOI QR Code

Optical Proximity Corrections for Digital Micromirror Device-based Maskless Lithography

  • Hur, Jungyu (Department of Mechanical System Engineering, Graduate School, Tongmyoung University) ;
  • Seo, Manseung (Department of Robot System Engineering, Tongmyong University)
  • 투고 : 2012.08.08
  • 심사 : 2012.08.24
  • 발행 : 2012.09.25

초록

We propose optical proximity corrections (OPCs) for digital micromirror device (DMD)-based maskless lithography. A pattern writing scheme is analyzed and a theoretical model for obtaining the dose distribution profile and resulting structure is derived. By using simulation based on this model we were able to reduce the edge placement error (EPE) between the design width and the critical dimension (CD) of a fabricated photoresist, which enables improvement of the CD. Moreover, by experiments carried out with the parameter derived from the writing scheme, we minimized the corner-rounding effect by controlling light transmission to the corners of a feature by modulating a DMD.

키워드

참고문헌

  1. A. K. Wong, Resolution Enhancement Techniques in Optical Lithography (SPIE Publications, Washington, USA, 2001).
  2. J. F. Chen, T. Laidig, K. E. Wampler, and R. Caldwell, "Optical proximity correction for intermediate-pitch features using sub-resolution scattering bars," J. Vac. Sci. Technol. B 15, 2426-2433 (1997).
  3. H. Zhang, J. Morrow, and F. M. Schellenberg, "Optical proximity correction: a detail comparison of techniques and their effectiveness," Microelec. Eng. 41-42, 79-82 (1998). https://doi.org/10.1016/S0167-9317(98)00017-3
  4. Y. Li, S. M. Yu, and Y. L. Li, "Intelligent optical proximity correction using genetic algorithm with model- and rule-based approaches," Comput. Mater. Sci. 45, 65-76 (2009). https://doi.org/10.1016/j.commatsci.2008.04.031
  5. O. W. Otto, J. G. Garofalo, K. K. Low, C. M. Yuan, R. C. Henderson, C. Pierrat, K. L. Kostelak, S. Vaidya, and P. K. Vasudev, "Automated optical proximity correction: a rules-based approach," Proc. SPIE 2197, 278-293 (1994).
  6. J.-S. Park, C.-H. Park, S.-U. Rhie, Y.-H. Kim, M.-H. Yoo, J.-T. Kong, H.-W. Kim, and S.-I. Yoo, "An efficient rule-based OPC approach using a DRC tool for 0.18 ${\mu}m$," ASIC Proc. IEEE 2000, 81-85 (2000).
  7. M. D. Levenson, N. S. Viswanathan, and R. A. Simpson, "Improving resolution in photolithography with a phase-shifting mask," IEEE Trans. Electr. Dev. 29, 1828-1836 (1982). https://doi.org/10.1109/T-ED.1982.21037
  8. Y. Liu, A. Zakhor, and M. Zuniga, "Computer aided design of phase shift mask designs with reduced complexity," IEEE Trans. Semiconductor Manufacturing 9, 170-181 (1996). https://doi.org/10.1109/66.492811
  9. Z. Cui, J. Dua, Q. Huanga, J. Sua, and Y. Guoa, "Optical proximity correction by grey tone photolithography," Microelec. Eng. 53, 153-156 (2000). https://doi.org/10.1016/S0167-9317(00)00285-9
  10. H. Shirota and A. Kuwabara, "Pattern writing apparatus and pattern writing method," U.S. Patent 6903798 (2005).
  11. U. B. Ljungblad, P. Askebjer, T. Karlin, T. Sandstrom, and H. Sjoeberg, "A high-end mask writer using a spatial light modulator," Proc. SPIE 5721, 43-52 (2005).
  12. T. Okuyama and H. Washiyama, "Multi-exposure drawing method and apparatus therefor," U.S. Patent 7136087 (2006).
  13. M. Seo and H. Kim, "Lithography upon micromirrors," Computer-Aided Design 39, 202-217 (2007). https://doi.org/10.1016/j.cad.2006.05.007
  14. J. Liang, R. N. Kohn Jr., M. F. Becker, and D. J. Heinzen, "High-precision laser beam shaping using a binary-amplitude spatial light modulator," Appl. Opt. 49, 1323-1330 (2010). https://doi.org/10.1364/AO.49.001323
  15. D.-H. LEE, "Optical system with 4 ${\mu}m$ resolution for maskless lithography using digital micromirror device," J. Opt. Soc. Korea 14, 266-276 (2010). https://doi.org/10.3807/JOSK.2010.14.3.266
  16. Y.-H. Huang and J.-Y. Jeng, "Forming a fresnel zone lens: effects of photoresist on digital-micromirror-device maskless lithography with grayscale exposure," J. Opt. Soc. Korea 16, 127-132 (2012). https://doi.org/10.3807/JOSK.2012.16.2.127
  17. Y. C. Pati and T. Kailath, "Phase-shifting masks for microlithography: automated design and mask requirements," J. Opt. Soc. Am. A 11, 2438-2452 (1994). https://doi.org/10.1364/JOSAA.11.002438
  18. A. Khoh, G. S. Samudra, Y. Wu, T. Milster, and B.-I. Choi, "Image formation by use of the geometrical theory of diffraction," J. Opt. Soc. Am. A 21, 959-967 (2004). https://doi.org/10.1364/JOSAA.21.000959
  19. X. Guo, J. Dub, X. Luo, Q. Deng, and C. Duc, "RET simulations for SLM-based maskless lithography," Microelec. Eng. 85, 929-933 (2008). https://doi.org/10.1016/j.mee.2008.01.055
  20. M. V. Kessels and K. Heggarty, "Optical proximity correction for a versatile LCD based direct write maskless photoplotter," Microelec. Eng. 86, 2385-2391 (2009). https://doi.org/10.1016/j.mee.2009.04.026
  21. C. Sun, N. Fang, D. M. Wu, and X. Zhang, "Projection microstereolithography using digital micro-mirror dynamic mask," Sens. Actuators A: Physical 121, 113-120 (2005). https://doi.org/10.1016/j.sna.2004.12.011
  22. W. D. Meisburger, "Apparatus for SLM-based optical lithography with gray level capability," U.S. Patent 7639416 B2 (2009).
  23. G. R. V. Kumar and K. Sayanagi, "Measurement of optical transfer function by its moments," J. Opt. Soc. Am. 58, 1369-1376 (1968). https://doi.org/10.1364/JOSA.58.001369
  24. J. R. Sheats and B. W. Smith, Microlithography: Science and Technology (Marcel Dekker, New York, USA, 1998).

피인용 문헌

  1. Detecting Digital Micromirror Device Malfunctions in High-throughput Maskless Lithography vol.17, pp.6, 2013, https://doi.org/10.3807/JOSK.2013.17.6.513
  2. In-line Critical Dimension Measurement System Development of LCD Pattern Proposed by Newly Developed Edge Detection Algorithm vol.17, pp.5, 2013, https://doi.org/10.3807/JOSK.2013.17.5.392
  3. Experimental Study of Numerical Optimization for 3-D Microstructuring Using DMD-Based Grayscale Lithography vol.24, pp.6, 2015, https://doi.org/10.1109/JMEMS.2015.2447548
  4. 3D nano/microfabrication techniques and nanobiomaterials for neural tissue regeneration vol.9, pp.6, 2014, https://doi.org/10.2217/nnm.14.36
  5. Simulation of the effect of incline incident angle in DMD Maskless Lithography vol.844, 2017, https://doi.org/10.1088/1742-6596/844/1/012031
  6. Reduction of buried microstructure diffraction in fabricating curved microstructure by multiple exposure method vol.26, pp.24, 2018, https://doi.org/10.1364/OE.26.031085