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Preparation of NaxWO3 (x= 1 and 0.75) Thin Films and Their Electrical Conduction Properties

NaxWO3 (x= 1, 0.75) 박막 제조 및 전기전도 특성

  • Lee, Seung-Hyun (Department of Materials Science and Engineering, Kunsan National University) ;
  • Sun, Ho-Jung (Department of Materials Science and Engineering, Kunsan National University)
  • 이승현 (군산대학교 신소재공학과) ;
  • 선호정 (군산대학교 신소재공학과)
  • Received : 2012.07.05
  • Accepted : 2012.07.23
  • Published : 2012.08.01

Abstract

The powders for the $Na_xWO_3$ (x= 1 and 0.75) sputtering targets were synthesized by the calcination in reductive atmosphere. Near single-phase $NaWO_3$ and single-phase $Na_{0.75}WO_3$ powder targets were prepared. By using the targets, thin films of each composition were deposited by rf magnetron sputtering on the $SiO_2$ (100 nm)/Si substrates and annealed by RTP (rapid thermal processing) for crystallization. In the case of the $NaWO_3$ composition, single-phase $Na_xWO_3$ thin films, where x was believed to be slightly less than 1, were fabricated accompanying the Na-diffusion into the substrates during RTP. However, in the case of the $Na_{0.75}WO_3$ thin film preparation, it was unable to make single-phase thin films. From the phase formation behaviors of both powders and thin films, it was revealed that $Na_xWO_3$ with nonstoichiometric composition of x, which was slightly less than 1, was favorable. The good electrical conduction properties were obtained from the single-phase $Na_xWO_3$ thin films. Their electrical resistivities were as low as $7.5{\times}10^{-4}{\Omega}{\cdot}cm$.

Keywords

References

  1. Ph. Labbe, Key Eng. Mater., 68, 293 (1992). https://doi.org/10.4028/www.scientific.net/KEM.68.293
  2. S. Raj, H. Matsui, S. Souma, T. Sato, T. Takahashi, A. Chakraborty, D. D. Sarma, P. Mahadevan, S. Oishi, W. H. McCarroll, and M. Greenblatt, Phys. Rev., B75, 155116 (2007).
  3. F. Takusagawa and R. A. Jacobson, J. Solid State Chem., 18, 163 (1976).
  4. R. Clarke, Phys. Rev. Lett., 39, 1550 (1977). https://doi.org/10.1103/PhysRevLett.39.1550
  5. A. S. Ribnick, B, Post, and E. Banks, Advan. Chem. Ser., 39, 246 (1963). https://doi.org/10.1021/ba-1964-0039.ch023
  6. C. G. Granqvist, Electrochim. Acta, 44, 3005 (1999). https://doi.org/10.1016/S0013-4686(99)00016-X
  7. L. D. Muhlestein and G. C. Danielson, Phys. Rev., 158, 825 (1967). https://doi.org/10.1103/PhysRev.158.825
  8. P. A. Lightsey, D. A. Lilienfeld, and D. F. Holcomb, Phys. Rev., B14, 4730 (1976).
  9. I. Chaitanya Lekshmi, A. Gayen, V. Prasad, S. V. Subramanyam, and M. S. Hegde, Mater. Res. Bull., 37, 1815 (2002). https://doi.org/10.1016/S0025-5408(02)00870-X
  10. J. Guo, C. Dong, L. Yang, and G. Fu, J. Solid State Chem., 178, 58 (2005). https://doi.org/10.1016/j.jssc.2004.10.017