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평행판 도파관을 이용한 유전율 측정 방법

A Permittivity Measurement of Dielectric Slabs Using a Parallel Plate Waveguide

  • 조규영 (공주대학교 대학원 정보통신공학과) ;
  • 박위상 (공주대학교 전기전자제어공학부)
  • 투고 : 2012.01.17
  • 심사 : 2012.04.13
  • 발행 : 2012.04.30

초록

평행판 도파관에 진행하는 TEM mode를 이용한 평판형 유전체의 유전율을 측정하는 방식을 소개한다. 이는 양 옆이 열린 구조적 장점으로 실험 절차 및 측정 샘플의 가공이 매우 간편한 장점이 있다. 샘플의 유무에 따라 변화하는 도파관 내에서 전파하는 TEM mode의 위상 속도의 차이를 전자기적으로 해석하였고 이를 이용하여 유전체판의 유전율을 측정하였으며, 샘플에 대한 측정 결과는 기존에 알려진 유전율과 일치하였다.

This paper introduces a simple new procedure approach to determine the permittivity of dielectric slabs. The method uses a parallel plate waveguide which supports a TEM mode. The presence of the dielectric slab placed at the bottom of the waveguide makes the speed of the TEM wave slower. The relationship between the change of the speed and the permittivity of the dielectric slab allows the determination of the permittivity. The relationship is analyzed electromagnetically, and the results of measurements are in good agreement with the analysis.

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참고문헌

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