참고문헌
- Dae-Woong Woo, Dong-Ryul Shin, Jeong-Pyo Kim, Gi-Ho Kim, Jeong-Keun Ji, Won-Mo Seong, Wee-Sang Park, "Bandwidth analysis of a jerusalem AMC based on equivalent medel," IWIT, vol. 10, no. 5, pp. 7-12, Oct, 2010
- A. M. Nicolson and G. F. Ross, "Measurement of the intrinsic properties of materials by time domain techniques," IEEE Trans. Instrum. Meas., vol. 19, no. 4, pp. 377-382, Nov. 1970 https://doi.org/10.1109/TIM.1970.4313932
- J. Baker-Jarvis, E. J. Vanzura, and W. A. Kissick, "Improved techniques for determining complex permittivity with the transmission/reflection method," IEEE Trans, Microw. Theory Tech., vol. 38, no. 8, pp. 1096-1103, Aug, 1990 https://doi.org/10.1109/22.57336
- G. Annino, M. Cassettari, I. Longo, and M. Martinelli, "Whispering gallery modes in a dielectric resonator: Characterization at millimeter wavelength," IEEE Trans. Microw. Theory Tech. Vol. 45. No 11. pp. 2025-2034, Nov. 1997 https://doi.org/10.1109/22.644226
- J. Krupka, K. Derazkowski, B. Riddle, and J. Baker-Jarvis, "A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature," Meas. Sci. Technol., vol. 9, pp. 1751-1756, 1998 https://doi.org/10.1088/0957-0233/9/10/015
- M. D. Janezic, and J. Barker-Jarvis, "Full-wave analysis of a split cylinder resonator for nondestructive permittivity measurements," IEEE Trans. Microw. Theory Tech. Vol. 47. No 10. pp. 2014-2019, Oct. 1999 https://doi.org/10.1109/22.795077
- M. D. Janezic, E. F. Kuester, and J. Barker-Jarvis, "Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator," 2004 IEEE MTT-SDigest, pp. 1817-1820, June 2004
- David M. Pozar, Microwave Engineering. 3rd Ed., NewYork: Wiley, 2005, ch. 3
- S. G. Kim and K. Chang, "Ultra wide-band transitions and new microwave components using double-sided parallel-strip lines," IEEE Trans. Microw. Theory Tech., vol. 52, no. 9, pp. 2148-2152, Sep. 2004 https://doi.org/10.1109/TMTT.2004.834165
- Sung-Jin Muhn, Wee-Sang Park, "Regression progress to evaluate metal scale thickness using microwave," IWIT, vol. 10, no. 5, pp. 1-6, Oct, 2010