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앙상블 학습을 이용한 DRAM 모듈 출하 품질보증 검사 불량 예측

Fail Prediction of DRAM Module Outgoing Quality Assurance Inspection using Ensemble Learning Algorithm

  • 투고 : 2011.12.16
  • 심사 : 2012.03.22
  • 발행 : 2012.06.01

초록

The DRAM module is an important part of servers, workstations and personal computer. Its malfunction causes a lot of damage on customer system. Therefore, customers demand the highest quality products. The company applies DRAM module Outgoing Quality Assurance Inspection(OQA) to secures the highest quality. It is the key process to decides shipment of products through sample inspection method with customer oriented tests. High fraction of defectives entering to OQA causes inevitable high quality cost. This article proposes the application of ensemble learning to classify the lot status to minimize the ratio of wrong decision in OQA, observing a potential in reducing the wrong decision.

키워드

참고문헌

  1. Aghaie, A., Samimi, Y., and Asadzadeh, S. (2010), Monitoring and diagnosing a two-stage production process with attribute characteristics, Iranian Journal of Operations Research, 1-16.
  2. An, D. W., Ko, H. H., Baek, J. G., Kim, S. S., and Kim, J. Y. (2009), A Yield Prediction in the Semiconductor Manufacturing Process Using Stepwise Support Vector Machine, IE Interfaces, 252-253.
  3. Cortes, C. and Vapnik, V. (1995), Support-vector networks, Machine Learning, 273-297.
  4. Freund, Y. and Mason, L. (1999), The alternating decision tree learning algorithm, Proceeding of the Sixteenth International Conference on Machine Learning, 124-133.
  5. Frank, V. G. (2005), LARS Library : Least angle Regression Stagewise Library www.applied-mathmatics.net/identification/LARSLibdoc.pdf.
  6. Han, J. and Kamber, M. (2006), K-Folded Cross Validation, Data Mining, 344-345.
  7. Jang, D. J. and Bae, S. J. (2009), Hybrid Dcatamining Algorithm for Monitoring Input Variables in Semiconductor Manufacturing Process, Conference of the korean Institute of Industrial Engineers, 1-7.
  8. Kang, S. P., Cho, S. J., and Lee, H. J. (2006), Ensemble of Under-Sampled SVMs for Data Imbalance Problems, Neural Information Processing, 837-846.
  9. Khoshgoftaar, T. M., Jason, V. H., Chris, S., and Zhao, L. (2007), The multiple imputation quantitative noise corrector, Journal of Intelligent Data Analysis, 11, 245-263.
  10. Kim, D. I., Park, J. S., Beak, J. G., and Kim, S. S. (2009), Multi-objective Genetic Algorithm for Variable Selection in Linear Regression Model and Application, Journal of Korea Society for Simulation, 137-148.
  11. Kim, Y. J. (2007), In the second half of the semiconductor inducstry outlook, Industrial Research, 1-20.
  12. Kotsiantis, B. S. (2007), Combining Bagging and Additive Regression, Journal of Computational and Mathematical Sciences, 62-67.
  13. Kwok, K. Y. and Tummala, V. M. (1998), A quality control and improvement system based on the total control methodology (TCM), Journal of Quality and Reliability Management, 13-48.
  14. Lee, Z. J., Ying, K. C., Chen, S. C., and Lin, S. W. (2008), Applying PSO-based BPN for predicting the yield rate of DRAM modules produced using defective ICs, Journal of Advanced Manufacturing Technology, 9-12.
  15. Leo, B. (1996), Bagging Predictors, Machine Learning, 123-140.
  16. Meinshausen, N. and Bühlmann, P. (2010), Stability selection, Journal of the Royal Statistical Society, 417-473.
  17. Park, S. H., Kim, J. S., Kim, S. S., Park, C. S., and Baek, J. G. (2010), A Fault Detection of Cyclic Signals Using Support Vector Machine-Regression, Journal of The Korean Operations Research and Management Science Society, 354-362.
  18. Pesotchinsky, L. (1987), Problems Associated with Quality control Sampling in Modern IC Manufacturing, IEEE Transaction on Hybrids and Manufacturing Technology, 101-107.
  19. Pieter, P. B. (2000), 2000 Begins with a revised industry roadmap, Solid State Technology, 31-44.
  20. Shah, R. and Richard, J. (2011), Variable selection with error control, Another look at Stability Selection arXiv.org, 1-33.
  21. Shih, W. L. and Shih, C. (2009), Predicting the Yield Rate of DRAM Modules by Support Vector Regression, Global Perspective for Competitive Enterprise, Economy and Ecology Advanced Concurrent Engineering, 747-755.
  22. Son, J. H., Ko, J. M. and Kim, C. O. (2009), Feature Based Decision Tree Model for Fault Detection and Classification of Semiconductor Process, IE Interfaces, 126-134.
  23. Son, Y. T. and Yun, D. K. (2011), Detection to Non-linear Multivariate Process Using Supervised Learning Methods, IE interfaces, 8-14.

피인용 문헌

  1. Under Sampling for Imbalanced Data using Minor Class based SVM (MCSVM) in Semiconductor Process vol.40, pp.4, 2014, https://doi.org/10.7232/JKIIE.2014.40.4.404