Journal of the Semiconductor & Display Technology (반도체디스플레이기술학회지)

The Korean Society Of Semiconductor & Display Technology (한국반도체디스플레이기술학회)
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System Design for High-speed Visual Inspection of Electronic Components

전자부품의 고속 외관검사를 위한 시스템 설계

  • Yoo, Seungryeol (School of Mechanical Engineering, Korea University of Technology and Education)
  • 유승열 (한국기술교육대학교 기계공학부)
  • Received : 2012.08.27
  • Accepted : 2012.09.17
  • Published : 2012.09.30
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Abstract

Electronics in modern lives have become more miniaturized and precise. Multi Layered Ceramic Capacitor (MLCC) occupies 50% of electronic components consisting of electronics. This high volume of the production needs high speed and more precise machine performances. The dominate parts of the production equipments are the module transporting components and the visual inspection module. Most visual inspection has been off-line because of the image processing time. In this paper, a new image processing method is proposed to reduce thousands of matrix calculation for image processing and realize on-line high speed inspection.

Keywords

References

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