DOI QR코드

DOI QR Code

Real-time Measurement of Full Field Retardation Near Quarter Wavelength

  • Liu, Longhai (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences) ;
  • Zeng, Aijun (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences) ;
  • Yuan, Qiao (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences) ;
  • Zhu, Linglin (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences) ;
  • Fang, Ruifang (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences) ;
  • Huang, Huijie (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
  • 투고 : 2012.07.13
  • 심사 : 2012.10.23
  • 발행 : 2012.12.25

초록

A real-time method to measure full field retardation near quarter wavelength is proposed. The circularly polarized beam passes through a sample with a large aperture. The measuring beam then goes through a quarter-wave plate and is then split by a Wollaston prism. An image with two sub-images is then detected by a high-speed image sensor. The full field retardation near quarter wavelength can be obtained in real time by processing the image. The measured retardation is independent of the fast axis angle of the sample and the fluctuation of the initial intensity. In experiments, a wedge waveplate is measured with different fast axis angle and initial intensity, and the full field retardations are acquired. The maximum and standard deviation of the full field retardation is $1.5^{\circ}$ and $0.4^{\circ}$. The validity of the method is verified.

키워드

참고문헌

  1. W. S. Kang, J. W. Moon, and G. D. Lee, "Retardation free in-plane switching liquid crystal display with high speed and wide-view angle," J. Opt. Soc. Korea 15, 161-167 (2011). https://doi.org/10.3807/JOSK.2011.15.2.161
  2. N. M. Dragomir, X. M. Goh, C. L. Curl, L. M. D. Delbridge, and A. Roberts, "Quantitative polarized phase microscopy for birefringence imaging," Opt. Express 15, 17690-17698 (2007). https://doi.org/10.1364/OE.15.017690
  3. J. H. Kim, J. Oh, H. W. Kang, H. Lee, and J. H. Kim, "Detection of tendon tears by degree of linear polarization imaging," J. Opt. Soc. Korea 13, 472-477 (2009). https://doi.org/10.3807/JOSK.2009.13.4.472
  4. J. F. Lin and Y. L. Lo, "Measurement of optical rotation and phase retardance of birefringence samples with depolarization effects using linearly and circularly polarized probe lights," Opt. Lasers Eng. 47, 948-955 (2009). https://doi.org/10.1016/j.optlaseng.2009.03.017
  5. S.-G. Kim, "Phase error analysis in polarization phase-shifting technique using a Wollaston prism and wave plates," J. Opt. Soc. Korea 8, 122-126 (2004). https://doi.org/10.3807/JOSK.2004.8.3.122
  6. B. Wang and T. C. Oakberg, "A new instrument for measuring both the magnitude and angle of low level linear birefringence," Rev. Sci. Instrum. 70, 3847-3854 (1999). https://doi.org/10.1063/1.1150000
  7. A. Zeng, F. Li, L. Zhu, and H. Huang, "Simultaneous measurement of retardance and fast axis angle of a quarter-wave plate using one photoelastic modulator," Appl. Opt. 50, 4347-4352 (2011). https://doi.org/10.1364/AO.50.004347
  8. W. Pin and A. Asundi, "Full-field retardation measurement of a liquid crystal cell with a phase shift polariscope," Appl. Opt. 47, 4391-4395 (2008). https://doi.org/10.1364/AO.47.004391
  9. L. Giudicotti and M. Brombin, "Data analysis for a rotating quarter-wave, far- infrared Stokes polarimeter," Appl. Opt. 46, 2638-2648 (2007). https://doi.org/10.1364/AO.46.002638
  10. C. C. Montarou, T. K. Gaylord, B. L. Bachim, A. I. Dachevski, and A. Agarwal, "Two-wave-plate compensator method for full-field retardation measurements," Appl. Opt. 45, 271-280 (2006). https://doi.org/10.1364/AO.45.000271
  11. R. Oldenbour and G. Mei, "New polarized light microscope with precision universal compensator," J. Microsc. 180, 140-147 (1995). https://doi.org/10.1111/j.1365-2818.1995.tb03669.x
  12. W. C. Kuo, K. Y. Liao, G. J. Jan, H. K. Teng, and C. Chou, "Simultaneous measurement of phase retardation and fast-axis angle of phase retardation plate," Jpn. J. Appl. Phys. 44, 1095-1100 (2005). https://doi.org/10.1143/JJAP.44.1095
  13. P. Kurzynowski, S. Drobczynski, and W. A. Wozniak, "Dynamic polarization states and birefringence distributions measurements in spatial elliptical polariscope using Fourier analysis method," Opt Express 17, 10144-10154 (2009). https://doi.org/10.1364/OE.17.010144
  14. www.strainoptics.com.