An Accelerated Life Test of LED Lights for Aviation Taxiway

항공유도로등화용 LED 광원의 가속수명시험

  • Min, Kyong-Chan (Reliability Assessment Team, Korea Testing Certification) ;
  • Yun, Yang-Gi (Reliability Assessment Team, Korea Testing Certification) ;
  • Kim, Myung-Soo (Dept. of Industrial Information Engineering, Univ. of Suwon)
  • 민경찬 (한국기계전기전자시험연구원 신뢰성평가팀) ;
  • 윤양기 (한국기계전기전자시험연구원 신뢰성평가팀) ;
  • 김명수 (수원대학교 산업정보공학과)
  • Received : 2011.03.04
  • Accepted : 2011.06.03
  • Published : 2011.06.25

Abstract

This paper presents an accelerated life test of aviation taxiway lights installed in the airport to help safe navigation of airplanes at night or in bad weather. Recently halogen lamps of taxiway lights are replaced by LED ones and their reliability needs yet to be verified. Thus, effective test conditions are designed reflecting the failure modes and mechanisms from the previous studies on LED, which include the accelerated degradation process. The test is performed under the temperature $70^{\circ}C$ and $90^{\circ}C$ for two types of LED lights, taxiway center line lights(TCLL) and taxiway edge lights (TEDL). The failure time data were analyzed using lognormal distribution and Arrhenius model to find the life-stress relationship, acceleration factor and life characteristics under the normal condition temperature $30^{\circ}C$.

Keywords

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