References
- J. L. Hudgins, G. S. Simin, E. Santi, and M. A. Khan, "An assessment of wide bandgap semiconductors for power devices," IEEE Trans. Power Electron., Vol. 18, No.3, pp. 907-914, May 2003. https://doi.org/10.1109/TPEL.2003.810840
- M. E. Levinshteina, P. A. Ivanova, M. S. Boltovetsb, V. A. Krivutsab, J. W. Palmourc, M. K. Dasc, and Brett A. Hullc, "High-temperature (up to 773 K) operation of 6-kV 4H-SiC junction diodes," Solid-State Electronics, Vol. 49, No.7, pp. 1228-1232, Jul. 2005. https://doi.org/10.1016/j.sse.2005.04.020
- M. Holza, G. Hultschb, T. Scherga, and R. Ruppa, "Reliability considerations for recent Infineon SiC diode releases," Microelectronics Reliability, Vol. 47, No. 9-11, pp. 1741-1745, Sep./Nov. 2007. https://doi.org/10.1016/j.microrel.2007.07.031
- R. Singh, S.-H. Ryu, D. C. Capell, and J. W. Palmour, "High temperature SiC trench gate p-IGBTs," IEEE Trans. Electron Devices, Vol. 50, No. 3, pp. 774-784, May 2003. https://doi.org/10.1109/TED.2003.811388
-
J. H. Zhao, L. Fursin, L. Jiao, X. Li, and T. Burke, "Demonstration of 1789 V,
$6.68m{\Omega}-cm2$ 4H-SiC merged- PiN-Schottky diodes," Electron Devices Letters, Vol. 40, No. 6, Mar. 2004. - Y. Sugawara, D. Takayama, K. Asano, A. Agarwal, S. Ryu, J. Palmour, and S. Ogata, "12.7KV Ultra High Voltage SiC Commutated Gate Turnoff Thyristor:SiCGT," Symposium on Power Semiconductor Devices & ICs, pp. 365-368, 2004.
-
T. Kimoto, H. Kawano, and J. Suda, "1330 V, 67
$m{\Omega}cm2$ 4H-SiC (0001) RESURF MOSFET," Electron Devices Letter, Vol. 26, No.9, pp. 649-651, Sep. 2005. https://doi.org/10.1109/LED.2005.854371 - P. A. Ivanova, M. E. Levinshteina, J. W. Palmourb, M. K. Dasb, and B. A. Hull, "High power 4H-SiC P-i-N diodes (10 kV class) with record high carrier lifetime," Solid-State Electronics, Vol. 50, No. 7-8, pp. 1368-1370. Jul./Aug. 2006. https://doi.org/10.1016/j.sse.2006.06.018
- S.-H. Ryu, S. Krishnaswami, B. Hull, J. Richmond, A. Agarwal, and A. Hefner, "10 kV, 5A 4H-SiC Power DMOSFET", International Symposium on Power Semiconductor Devices & ICs, pp. 1-4, 2006.
-
J. Zhang, P. Alexandrov, T. Burke, J. H. Zhao, "4H-SiC Power Bipolar Junction Transistor With a Very Low Specific ON-Resistance of 2.9
$m{\Omega}$ cm2," Electron Devices Letter, Vol. 27, No. 5, pp. 368-370, May 2006. https://doi.org/10.1109/LED.2006.873370 -
M. Su, K. Sheng, Y. Li, Y. Zhang, J. Wu, J. H. Zhao, J. Zhang, and L. X. Li, "430-V
$12.4-m{\Omega}$ cm2 Normally OFF 4H-SiC Lateral JFET," Electron Devices Letter, Vol. 27, No. 10, pp. 834-836, Oct. 2006. https://doi.org/10.1109/LED.2006.883057 - R. Kraus and H. J. Mattausch, "Status and Trend of Power Semiconductor Device Models for Circuit Simulation," IEEE Transaction Power Electronics, Vol. 13, No. 6, pp. 452-465, May 1998. https://doi.org/10.1109/63.668107
- T. McNutt, A. Hefner, A. Mantootha, D. Berningb, and R. Singhb "Compact models for silicon carbide power devices," Solid-State Electronics, Vol. 48, No. 10-11 pp. 1757-1762, Oct./Nov. 2004. https://doi.org/10.1016/j.sse.2004.05.059
- M. E. Levinshtein , T. T. Mnatsakanov, P. A. Ivanov, R. Singh, J. W. Palmour, and S. N. Yurkov "Steady-state and transient characteristics of 10 kV 4H-SiC diodes", Solid-State Electronics, Vol. 48, No. 5, pp. 807-811, May 2004. https://doi.org/10.1016/j.sse.2003.11.001
- T. R. McNutt, A. R. Hefner Jr., H. A. Mantootha, J. L. Dulierec, D. W. Berningb, and R. Singh, "Physics-based modeling and characterization for silicon carbide power diodes," Solid-State Electronics, Vol. 50, No. 3, pp. 388-398, Mar. 2006. https://doi.org/10.1016/j.sse.2006.01.013
- M. Loulou, M. Abdelkrim, R. Gharbi, M. Fathallah, C. F. Pirri, E. Tresso, and A. Tartaglia "Modelling and analysis of a-SiC:H p-i-n photodetectors: Effect of hydrogen dilution on dynamic model," Solid-State Electronics, Vol. 51, No. 7, pp. 1067-1072, Jul. 2007. https://doi.org/10.1016/j.sse.2007.05.012
- S. Sze, Physics of Semiconductor Devices, John Wiley & Sons, 1981.
- D. A. Neamen; Semiconductor Physics and Devices. University of New Mexico, USA. McGraw Hill, 2003.
- A. S. Grove, Physics and Technology of Semiconductor Devices, Wiley, pp. 184-185, 1967.
- A. T. Bryant, L. Lu, E. Santi, P. R. Palmer, and J. L. Hudgins, "Physical modeling of fast p-i-n diodes with carrier lifetime zoning, part I: Device model," IEEE Transaction Power Electronics, Vol. 23, No. 1, pp. 195-196, Jan. 2008.
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