References
- D. L. Smith and C. Mailhiot, J. Appl. Phys. 62, 2545 (1987). https://doi.org/10.1063/1.339468
- B. -M. Nguyen, D. Hoffman, P. -Y. Delaunay, and M. Razeghi, Appl. Phys. Lett. 91, 163511 (2007). https://doi.org/10.1063/1.2800808
- P. Piquini, A. Zunger, and R. Magri, Phys. Rev. B 77, 115314 (2008). https://doi.org/10.1103/PhysRevB.77.115314
- E. Plis, J. B. Rodriguez, H. S. Kim, G. Bishop, Y. Sharma, R. Dawson, S. J. Lee, C. E. Jones, V. Gopal, and S. Krishna, Appl. Phys. Lett. 91, 133512 (2007). https://doi.org/10.1063/1.2790078
- S. J. Lee, S. K. Noh, E. Plis, S. Krishna, and K.-S. Lee, Appl. Phys. Lett. 95, 102106 (2009). https://doi.org/10.1063/1.3212738
- S. Mou, A. Petschke, Q. Liu, S. L. Chuang, J. V. Li, and C. J. Hill, Appl. Phys. Lett. 92, 153505 (2008). https://doi.org/10.1063/1.2909538
- S. Maison and G. W. Wicks, Appl. Phys. Lett. 89, 151109 (2006). https://doi.org/10.1063/1.2360235
- A. Khoshakhlagh, J. B. Rodriguez, E. Plis, G. D. Bishop, Y. D. Sharma, H. S. Kim, L. R. Dawson, and S. Krishna, Appl. Phys. Lett. 91, 263504 (2007). https://doi.org/10.1063/1.2824819
- E. Crobin, M. J. Shaw, M. R. Kitchin, J. P. Hagon, and M. Jaros, Semicond. Sci. Technol. 16, 263 (2001). https://doi.org/10.1088/0268-1242/16/4/314
- H. S. Kim, E. Plis, J. B. Rodriguez, G. D. Bishop, Y. D. Sharma, L. R. Dawson, S. Krishna, J. Bundas, R. Cook, D. Burrows, R. Dennis, K. Patnaude, A. Reisinger, and M. Sundaram, Appl. Phys. Lett. 92, 183502 (2008). https://doi.org/10.1063/1.2920764
- S. J. Lee, S. K. Noh, S. H. Bae, and H. Jung, J. Korean Vac. Soc. In print (2010).
- S. Maison and G. W. Wicks, Appl. Phys. Lett. 89, 151109 (2006). https://doi.org/10.1063/1.2360235
- S. J. Lee, S. K. Noh, L. R. Dawson, and S. Krishna, J. Korean Phys. Soc. 54, 280 (2009). https://doi.org/10.3938/jkps.54.280
- X. B. Zhang, J. H. Ryou, R. D. Dupuis, S. Mou, S. L. Chuang, C. Xu, and K. C. Hsieh, J. Cryst. Growth 287, 545 (2006). https://doi.org/10.1016/j.jcrysgro.2005.10.025
- G. C. Dente and M. L. Tilton, J. Appl. Phys. 86, 1420 (1999). https://doi.org/10.1063/1.370905
- X. B. Zhang, J. H. Ryou, R. D. Dupuis, C. Xu, S. Mou, A. Petschke, K. C. Hsieh, and S. L. Chuang, Appl. Phys. Lett. 90, 131110 (2007). https://doi.org/10.1063/1.2717524
- A. Fasolino, E. Molinari, and J. C. Maan, Phys. Rev. B 33, 8889 (1986). https://doi.org/10.1103/PhysRevB.33.8889
- J. Steinshnider, M. Weimer, R. Kaspi, and G. W. Turner, Phys. Rev. Lett. 85, 2953 (2000). https://doi.org/10.1103/PhysRevLett.85.2953
- H. Kroemer, Physica E 20, 196 (2004). https://doi.org/10.1016/j.physe.2003.08.003
- J. O. Kim, H. W. Shin, J. W. Choe, S. J. Lee, C. S. Kim, and S. K. Noh, J. Korean Vac. Soc. 18, 245 (2009). https://doi.org/10.5757/JKVS.2009.18.4.245
- B. J. Spencer, P. W. Voorhees, and J. Tersoff, Phys. Rev. B 64, 235318 (2001). https://doi.org/10.1103/PhysRevB.64.235318
- J. H. Li, D. W. Stokes, O. Caha, S. L. Ammu, J. Bai, K. E. Bassler, and S. C. Moss, Phys. Rev. Lett. 95, 096104 (2005). https://doi.org/10.1103/PhysRevLett.95.096104
Cited by
- A Study on THz Generation and Detection Characteristics of InGaAs Semiconductor Epilayers vol.21, pp.5, 2012, https://doi.org/10.5757/JKVS.2012.21.5.264
- Influence of InGaAs Capping Layers on the Properties of InAs/GaAs Quantum Dots vol.21, pp.6, 2012, https://doi.org/10.5757/JKVS.2012.21.6.342
- Optical Properties of InAs Quantum Dots Grown by Changing Arsenic Interruption Time vol.22, pp.2, 2013, https://doi.org/10.5757/JKVS.2013.22.2.86