다수 위치 측정에서 최소 기준에 의한 공정능력지수

The Process Capability Index of Minimum Base on the Multiple Measuring Locations

  • 이도경 (금오공과대학교 산업공학부)
  • Lee, Do-Kyung (Department of Industrial Engineering, Kumoh National Institute of Technology)
  • 투고 : 2011.11.15
  • 심사 : 2011.11.28
  • 발행 : 2011.12.31

초록

Process capability indices (PCls) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index $SC_{pm}$ (m) which is the minimum value of the location PCls.

키워드

과제정보

연구 과제 주관 기관 : 금오공과대학교

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