참고문헌
- B. O’Regan, and M. Gratzel, Nature 353, 737 (1991). https://doi.org/10.1038/353737a0
- Md. K. Nazeeruddin, R. Humphry-Baker, P. Liska, and M. Gratzel, J. Phys. Chem. B, 107, 8981 (2003). https://doi.org/10.1021/jp022656f
- S. Nakade, M. Matsuda, S. Kambe, Y. Saito, T. Kitamura, T. Sakata, Y. Wada, H. Mori, and S. Yanagida, J. Phys. Chem. B, 106, 10004 (2002). https://doi.org/10.1021/jp020051d
- Y. Chiba, A. Islam, Y. Watanabe, R. Komiya, N. Koide, and L. Han, Jpn. J. Appl. Phys., 45, 638 (2006). https://doi.org/10.1143/JJAP.45.638
- S. Ito, T. N. Murakami, P. Comte, P. Liska, C. Gratzel, M. K. Nazeeruddin, and M. Gratzel, Thin Solid Films, 516, 4613 (2008). https://doi.org/10.1016/j.tsf.2007.05.090
- W. J. Lee, E. Ramasamy, D. Y. Lee, and J. S. Song, Applied Materials & Interfaces, 1, 1145 (2009). https://doi.org/10.1021/am800249k
- J. G. Nam, Y. J. Park, B. S. Kim, and J. S. Lee, Scripta Materialia, 62, 148 (2010). https://doi.org/10.1016/j.scriptamat.2009.10.008
- J. Han, H. Kim, D. Y. Kim, S. M. Jo, and S. Jang, ACS Nano, 4, 3503 (2010). https://doi.org/10.1021/nn100574g
- J. Bonard, F. Maier, T. Stockli, A. Chatelain, W. A. Heer, J. Salvetat, and L. Forro, Ultramicroscopy, 73, 7 (1998). https://doi.org/10.1016/S0304-3991(97)00129-0
- J. E. Trancik, S. C. Barton, and J. Hone, Nano Lett., 8, 982 (2008). https://doi.org/10.1021/nl071945i
- W. J. Lee, D. Y. Lee, I. S. Kim, S. J. Jeong, and J. S. Song, Trans. Electr Electron. Mater., 6, 140 (2005). https://doi.org/10.4313/TEEM.2005.6.4.140
- S. I. Cha, B. K. Koo, S. H. Seo, and D. Y. Lee, J. Mater. Chem., 20, 659 (2010). https://doi.org/10.1039/b918920c
- M. Kang, Y. Han, H. Choi, and M. Jeon, Electron.. Lett., 46, 1509 (2010). https://doi.org/10.1049/el.2010.2606
- C. C. Ting, and W. S. Chao, Applied Energy, 87, 2500 (2010). https://doi.org/10.1016/j.apenergy.2010.02.024
- T. Ma, X. Fang, M. Akiyama, K. Inoue, H. Noma, and E. Abe, J. Electroanal Chem., 574, 77 (2004). https://doi.org/10.1016/j.jelechem.2004.08.002
- L. Han, N. Koide, Y. Chiba, and T. Mitate, Appl. Phys. Lett., 84, 2433 (2004). https://doi.org/10.1063/1.1690495
- L. Han, N. Koide, Y. Chiba, A. Islam, R. Komiya, N. Fuke, A. Fukui, and R. Yamanaka, Appl.. Phys. Lett., 86, 213501 (2005). https://doi.org/10.1063/1.1925773
- L. Han, N. Koide, Y. Chiba, A. Islam, and T. Mitate, C. R. Chimie, 9, 645 (2006). https://doi.org/10.1016/j.crci.2005.02.046
- K. Mizuno, J. Ishii, H. Kishida, Y. Hayamizu, S. Yasuda, D. N. Futaba, M. Yumura, and K. Hata, PNAS, 106, 6044 (2008).
- E. Ramasamy, W. J. Lee, D. Y. Lee, and J. S. Song, Electrachem Commun, 10, 1087 (2008). https://doi.org/10.1016/j.elecom.2008.05.013
- J. Yoon and K. Ryu, Karen Information Center News, 11, 15 (2008).