ETRI Journal

Electronics and Telecommunications Research Institute (한국전자통신연구원)
권호 표지
DOI QR코드

DOI QR Code

Measurement Accuracy of Oscillation-Based Test of Analog-to-Digital Converters

  • Mrak, Peter (Computer Systems Department, Jozef Stefan Institute) ;
  • Biasizzo, Anton (Computer Systems Department, Jozef Stefan Institute) ;
  • Novak, Franc (Computer Systems Department, Jozef Stefan Institute)
  • Received : 2009.07.13
  • Accepted : 2009.10.19
  • Published : 2010.02.28
Download PDF
⟨ Previous Next ⟩

Abstract

Oscillation-based testing of analog-to-digital converters represents a viable option for low-cost built-in self-testing in mixed-signal design. While numerous papers have addressed implementation issues, little attention has been paid to the measurement accuracy. In this letter, we highlight an inherent measurement uncertainty which has to be considered when deriving the parameters from the oscillation frequency.

Keywords

References

  1. K. Arabi and B. Kaminska "Oscillation-Test Strategy for Analog and Mixed-Signal Circuits," Proc. VLSI Test Symp., 1996, pp. 476-482.
  2. K. Arabi and B. Kaminska, "Design for Testability of Integrated Operational Amplifiers Using Oscillation-Test Strategy," Proc. Int. Conf. Comput. Design, 1996, pp. 40-45.
  3. K. Arabi and B. Kaminska, "Testing Analog and Mixed-Signal Integrated Circuits Using Oscillation-Test Method," IEEE Trans. Computer-Aided Design Integr. Circuits Syst., vol. 16, no. 7, 1997, pp. 745-753. https://doi.org/10.1109/43.644035
  4. G. Huertas et al., "Effective Oscillation-Based Test for Application to a DTMF Filter Bank," Proc. Int. Test Conf., 1999, pp. 549-555.
  5. M. Santo Zarnik, F. Novak, and S. Macek, "Design of Oscillation-Based Test Structures for Active RC Filters," IEE Proc. Circuits Devices Syst., vol. 147, no. 5, 2000, pp. 297-302. https://doi.org/10.1049/ip-cds:20000601
  6. P.M. Dias, J.E. Franca, and N. Paulino, "Oscillation Test Methodology for a Digitally-Programmable Switched-Current Biquad," Proc. IEEE Int. Mixed Signal Testing Workshop, 1996, pp. 221-226.
  7. K. Arabi and B. Kaminska, "Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of Analog and Mixed-Signal Integrated Circuits," Proc. Int. Test Conf., 1997, pp. 786-795.
  8. G. Huertas et al., "Oscillation-Based Test in Bandpass Oversampled A/D Converters," Microelectron. J., vol. 34, no. 10, 2003, pp. 927-936. https://doi.org/10.1016/S0026-2692(03)00163-0

Cited by

  1. Mitigation of Imperfect Carver-Induced Phase Distortions in a Coherent PM-RZ-QPSK Receiver vol.28, pp.24, 2010, https://doi.org/10.1109/jlt.2010.2090131
  2. On Measurement Uncertainty of ADC Nonlinearities in Oscillation-Based Test vol.62, pp.6, 2010, https://doi.org/10.2478/v10187-011-0057-4
  3. Histogram-Based Calibration Method for Pipeline ADCs vol.10, pp.6, 2010, https://doi.org/10.1371/journal.pone.0129736
  4. Oscillation-Based DFT for Second-Order Bandpass OTA-C Filters vol.37, pp.5, 2010, https://doi.org/10.1007/s00034-017-0648-9