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Series Resistance Change by Partial Shading in a-Si Thin Film Photovoltaic(PV) Module

부분 음영에 따른 a-Si Thin Film Photovoltaic(PV) Module의 직렬저항변화

  • Shin, Jun-Oh (Department of Electrical Engineering, Konkuk University) ;
  • Jung, Tae-Hee (Department of Electrical Engineering, Konkuk University) ;
  • Kim, Tae-Bum (Department of Electrical Engineering, Konkuk University) ;
  • Woo, Sung-Chul (Department of Electrical Engineering, Konkuk University) ;
  • Yun, Na-Ri (Department of Electrical Engineering, Konkuk University) ;
  • Kang, Ki-Hwan (Korea Institute of Energy Research) ;
  • Han, Deuk-Young (Department of Electrical Engineering, Konkuk University) ;
  • Ahn, Hyung-Keun (Department of Electrical Engineering, Konkuk University)
  • Received : 2010.08.13
  • Accepted : 2010.10.18
  • Published : 2010.11.01

Abstract

PV module has many power loss factors, and series resistance is the most important elements of them. It is therefore easy to expect the partial shading decrease the lifetime of the semiconductor depletion layer in thin film PV module. Different shading losses could be related with the hot spot which is critical in expecting the reliability issue. In this paper we have modelled the series resistance of the PV module with both different direction of the cell line and shading area of the panel. From the results, thin film a-Si PV module has shown different properties by shading direction.

Keywords

References

  1. A. Johansson, R. Gottschalg, D.G. Infield, 3rd World Conference on Photovoltaic Energy Conversion, (Osaka, Japan, 2003).
  2. Ruhi KAPLAN and Bengu KAPLAN, Turk J Phys. 26, 460, (2001).
  3. D. Sera, R. Teodorescu, P. Rodriguez, (IEEE International Symposium on Industrial Electronics ISIE, June 4-7, 2007) pp.2392-2396.
  4. S.R. Wenham, M.A. Green, M.E. Watt, R. Corkish, "APPLIED PHOTOVOLTAICS", (Earthscan Publications, 2007).
  5. Deuk-Young Han , "Electromagnetism", (INTER VISION, 2000), p182.
  6. Robert F. Pierret, "Semiconductor Device Fundamentals", (Addsion Wesley, 1997), p78.
  7. A. Al Tarabsheh, M. B. Schubert and J. H. Werner, (ICEGES, Nov 2009).
  8. E. Molenbroek, D.W. Waddington, K.A. Emmery, (IEEE, 1991) pp. 547-552.