DOI QR코드

DOI QR Code

The Electro-Optic Properties of Ferroelectric P(VDF-TrFE) LB Films

강유전성 고분자 P(VDF-TrFE) LB박막의 전기광학 특성

  • Kwak, Eun-Hwi (Laser and Optical Information Engineering, Cheongju University) ;
  • Jung, Chi-Sup (Laser and Optical Information Engineering, Cheongju University)
  • 곽은휘 (청주대학교 레이저광정보공학) ;
  • 정치섭 (청주대학교 레이저광정보공학)
  • Received : 2010.04.30
  • Accepted : 2010.06.21
  • Published : 2010.07.01

Abstract

Electro-optic modulators based on 25 monolayer langmuir-blodgett films of vinylidene fluoride and trifluoroethylene, P(VDF-TrFE), were fabricated. The LB films were prepared by transferring the monolayers on to an ITO coated glass with a surface pressure of 5 dyne/cm by use of the langmuir-schaefer deposition method. Measurement of the electro-optic coefficient has been carried out using a simple reflection techique. The E/O coefficient was found to be 154.9 pm/V and that value remained stable for at least 50 days.

Keywords

References

  1. P. N. Prasad and D. J. Williams, Introduction to nonlinear optical effects in molecules and polymers (John Wiley & Sons, New York, 1991).
  2. R. W. Munn and C. N. Ironside, Principles and Applications of Nonlinear Optical Materials (Blackie Academic & Professional, London, 1993).
  3. Nanotechnology Polymer Optical Modulator (Winter Green Research Inc., Massachusetts, USA, 2005).
  4. K. D. Singer, J. E. Sohn, and S. J. Lalama, Appl. Phys. Lett. 49, 248 (1986). https://doi.org/10.1063/1.97184
  5. M. Eich, B. Reck, D. Y. Yoon, C. G. Willson, and G. C. Bjorklund, J. Appl. Phys. 66, 3241 (1989). https://doi.org/10.1063/1.344115
  6. D. Jungbauer, B. Reck, R. Twieg, D. Y. Yoon, C. G. Willson, and J. D. Swalen, Appl. Phys. Lett. 56, 2610 (1990). https://doi.org/10.1063/1.102853
  7. P. M. Ranon, Y. Shi, and W. H. Steier, Appl. Phys. Lett. 62, 2605 (1993). https://doi.org/10.1063/1.109285
  8. G. Roberts, Langmuir–Blodgett films (Plenum, New York, 1990).
  9. S. Ducharme, S. P. Palto, L. M. Blinov, and V. M. Fridkin, AIP Conf. Proc. 535, 354 (2000) https://doi.org/10.1063/1.1324474
  10. S. Ducharme, T. J. Reece, C. M. Othon, and R. K. Rannow, IEEE Trans. Device Mater Reliab. 5, 720 (2005). https://doi.org/10.1109/TDMR.2005.860818
  11. C. C. Teng and H. T. Man, Appl. Phys. Lett. 56, 1734 (1990). https://doi.org/10.1063/1.103107
  12. J. S. Lim, G. S. Park, and Y. S. Lee, Kor. J. Opt. and Photon. 12, 225 (2001).