Journal of IKEEE (전기전자학회논문지)

Institute of Korean Electrical and Electronics Engineers (한국전기전자학회)
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The Development of Interoperability Tester for the IEC 61850 based on TTCN-3

TTCN-3 적합성 시험 언어를 이용한 IEC61850 상호 연동성 시험기 개발

  • Received : 2010.09.03
  • Accepted : 2010.09.29
  • Published : 2010.09.30
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Abstract

TTCN-3(Testing & Test Control Notation Version 3) is the international standard testing language defined by ETSI in 2001. TTCN-3 is generally used for protocol conformance test, but it is also possible to be applied to the platform and API tests based on CORBA. Moreover, it can be also applied to the various testings such as interworking testing, repetition testing, platform testing, etc. IEC 61850 is the protocol proposed for SAS(Substation Automation System) of SCADA(Supervisory Control And Data Acquisition) system. In this paper, a IEC 61850 interoperability Tester based TTCN-3 is developed under the Window environment. IEC 61850 Server Simulator of Linux operating system is used as SUT(System Under Test). Conformance testing items in this paper are the Positive test case_Srv5 of "Server, Logical device, Logical node, and data model" in the testing group of "IEC 61850 - Part10" document.

TTCN-3(Testing & Test Control Notation Version 3)은 2001년 ETSI에서 표준화한 국제 표준 테스트 언어이다. TTCN-3은 프로토콜 적합성 시험에 일반적으로 사용하고, 특정 부분의 모듈이나, CORBA 기반의 플랫폼 및 API 시험 등에 적용이 가능하다. 또한 적합성 시험뿐만 아니라 연동 시험, 반복 시험, 플랫폼 시험 등의 다양한 시험에 적용이 가능하다. IEC61850 은 SCADA(Supervisory Control And Data Acquisition) 시스템에서 SAS(Substation Automation System)를 위해 제안된 프로토콜이다. 본 논문에서는 TTCN-3 적합성 시험 언어를 이용하여 IEC 61850 상호 연동성 시험기를 Windows 환경에서 구현하였다. SUT(System Under Test)로는 리눅스 운영체제 기반의 IEC61850 Server Simulator를 사용하였다. 본 논문에서 시험한 적합성 시험 항목은 "IEC61850 - Part10" 문서의 테스트 항목들 중 "Server, Logical device, Logical node, and data model"의 Positive test case_Srv5 항목을 시험하였다.

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References

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