References
- M. Abtew, G. Selvaduray, "Lead-free Solders in Microelectronics", Mat. Sci. Eng. R, Vol. 27, pp. 95-141, 2000. https://doi.org/10.1016/S0927-796X(00)00010-3
- E.H. Wong, S.K.W. Seah, V.P.W. Shim, "A review of board level solder joints for mobile applications", Microelectron. Reliability, Vol. 48, pp. 1747-1758, 2008. https://doi.org/10.1016/j.microrel.2008.08.006
- E.H. Wong, "Dynamics of board level drop impact", ASME Trans J Electron Package, Vol. 127, pp. 200-207, 2005. https://doi.org/10.1115/1.1938987
- K. Mishiro, S. Ishikawa, M. Abe, T. Kumai, Y. Higashiguchi, K. Tsubone, "Effect of the drop impact on BGA/CSP package reliability", Microelectron. Reliability, Vol. 42, pp. 77-82, 2002. https://doi.org/10.1016/S0026-2714(01)00230-X
- JEDEC Standard JESD22-B111, "Board Level Drop Test Method of Components for Handheld Electronic Products", 2000.
- 권용상, 고국종, 김호경, "피에조를 이용한 초소형 단일 솔더볼 연결부의 전단 시험장치 개발", 한국윤활학회지, Vol. 26, No. 1, pp. 44-51, 2010.
- H.K. Kim, F.A. Mohamed, J.C. Earthman, "Noble specimen geometry for double shear creep experiments", Journal of Testing and Evaluation, Vol. 19, pp. 93-96, 1991. https://doi.org/10.1520/JTE12540J
- J. Chia, B. Cotterell, T. Chai, "The mechanics of the solder ball shear test and the effect of shear rate", Mater. Sci. Eng., Vol. A417, pp. 259-274, 2006.
- J. Lee, D. Park, J. Moon, Y. Lee, D. Shin, Y. Kim, "Reliability of composite solder bumps produced by an in-situ process", J. Electronic Mat., Vol. 29, No. 10, pp. 1264-1269, 2000. https://doi.org/10.1007/s11664-000-0022-7
- F. Zhang, M. Li, B. Balakrisnan, W. T. Chen, "Failure mechanism of lead-free solder joints in flip chip packages", J. Electronic Mat. Vol. 31, No. 11, pp. 1256-1263, 2002. https://doi.org/10.1007/s11664-002-0018-6
- W.H Bang, C.U. Kim, S.H. Kang, K.H. Oh, "Fracture mechanics of solder bumps during ball shear testing: effect of bump size", J. Electronic Mat., Vol. 38, No.9, pp. 1896-1905, 2009. https://doi.org/10.1007/s11664-009-0842-z
- L.M. Yin, X.P. Zhang, C, Lu, "Size and volume effects on the strength of micro scale lead-free solder joints", J. Electronic Mat. Vol. 38, No. 10, pp. 2179-2183, 2009. https://doi.org/10.1007/s11664-009-0858-4
- S.T. Jeng, H.H. Chang, Y.S. Lai, T.Y. Tsai, "High strain rate behavior for Sn-37Pb eutectic alloy, lead-free Sn-1Ag-0.5Cu and Sn-3Ag-0.5Cu alloys", Microelectron. Reliability, Vol. 49, pp. 310-317, 2009. https://doi.org/10.1016/j.microrel.2009.01.002
- D. Herkommer, M. Reid, J. Punch, "In situ optical creep observation of joint scale tin-silver- copper solder shear samples", J. Electronic Mat. Vol. 38, No. 10, pp. 2085-2095, 2009. https://doi.org/10.1007/s11664-009-0885-1