한국지능시스템학회논문지 (Journal of the Korean Institute of Intelligent Systems)

  • 제20권6호
  • /
  • Pages.837-842
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  • 2010
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  • 1976-9172(pISSN)
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  • 2288-2324(eISSN)
한국지능시스템학회 (Korean Institute of Intelligent Systems)
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이진 병합에 의한 양자암호 취약성

(An) analysis of quantum cryptography vulnerability by Binary merge

  • 투고 : 2010.07.23
  • 심사 : 2010.12.06
  • 발행 : 2010.12.25
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⟨ 이전 논문 다음 논문 ⟩

초록

본 논문에서는 양자암호 시스템의 설계과정에서 필연적으로 사용되는 의사난수들의 비트열들이 다수개 존재하는 현상과 이를 상호 공개된 채널에서 부분정보를 공유해야 하는 상황은 비트열들의 쌍을 노출시킨다. 본고에서는 이러한 의사난수 열의 기본 테스트 과정과 이를 벗어나는 이진 병합 비트열의 난수성에 대하여 살펴본다.

In this paper, quantum cryptography systems used in the design process inevitably open bit stream of pseudo-random number that exists multiple open channels between them and the need to share information on the part of the situation exposes a pair of bit stream. In this paper, the base test of pseudo-random number I tested out this process and the merge bit binary column look out for randomness.

키워드

참고문헌

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