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Synthesis and Characterization of Al-Doped Zinc Oxide Films by an Radio Frequency Magnetron Sputtering Method for Transparent Electrode Applications

  • Seo, Jae-Keun (Department of Electrical Engineering, Hanbat National University) ;
  • Ko, Ki-Han (Department of Electrical Engineering, Hanbat National University) ;
  • Cho, Hyung-Jun (Department of Electrical Engineering, Hanbat National University) ;
  • Choi, Won-Seok (Department of Electrical Engineering, Hanbat National University) ;
  • Park, Mun-Gi (LG Display Co., Ltd.) ;
  • Seo, Kyung-Han (LG Display Co., Ltd.) ;
  • Park, Young (Korea Railroad Research Institute) ;
  • Lim, Dong-Gun (Department of Electronic Engineering, Chungju National University)
  • Published : 2010.02.28

Abstract

In this study, transparent and conductive Al-doped zinc oxide (AZO) films were prepared on a glass substrate by an radio frequency (RF) magnetron sputtering method using a 150-nm-thick AZO target (Al: 2 wt.%) at room temperature. We investigated the effects of RF power between 100-350 W (in steps of 50 W) on the structural, electrical, and optical properties of the AZO films. The thickness and cross-sectional images of the films were observed by field emission scanning electron microscopy. The thicknesses of all films were kept constant at 150 nm and grown on a glass substrate. The grain sizes of the AZO films were determined with the X-ray diffraction by using the Scherrer' equation, and their electrical properties were investigated using a Hall effect electronic transport measurement system. The transmittance of the AZO films was also measured by an ultraviolet-visible spectrometer.

Keywords

References

  1. K. Matsubara, P. Fons, K. Iwata, A. Yamada, K. Sakurai, H. Tampo,and S. Niki, Thin Solid Films 431-432, 369 (2003) [DOI: 10.1016/s0040-6090(03)00243-8].
  2. C. P. Liu and G. R. Jeng, J. Alloys Compd. 468, 343 (2009) [DOI:10.1016/j.jallcom.2008.01.053].
  3. K. Ellmer, J. Phys. D: Appl. Phys. 33, R17 (2000) [DOI:10.1088/0022-3727/33/4/201].
  4. E. Fortunato, P. Barquinha, A. Pimentel, A. Gonçalves, A.Marques, L. Pereira, and R. Martins, Thin Solid Films 487, 205(2005) [DOI: 10.1016/j.tsf.2005.01.066].
  5. H. Chen, H. J. Jin, C. B. Park, and G. C. Hoang, Trans. Electr. Electron. Mater. 10, 93 (2009). https://doi.org/10.4313/TEEM.2009.10.3.093
  6. S. Zhao, Y. Zhou, Y. Liu, K. Zhao, S. Wang, W. Xiang, Z. Liu, P. Han,Z. Zhang, Z. Chen, H. Lu, K. Jin, B. Cheng, and G. Yang, Appl. Surf.Sci. 253, 726 (2006) [DOI: 10.1016/j.apsusc.2006.01. 010].
  7. B. T. Lee, T. H. Kim, and S. H. Jeong, J. Phys. D: Appl. Phys. 39, 957(2006) [DOI: 10.1088/0022-3727/39/5/010].
  8. X. Feng, J. Phys.: Condens. Matter 16, 4251 (2004) [DOI:10.1088/0953-8984/16/24/007].
  9. Y. Y. Liu, H. J. Jin, C. B. Park, and G. C. Hoang, Trans. Electr.Electron. Mater. 10, 24 (2009). https://doi.org/10.4313/TEEM.2009.10.1.024
  10. J. Mass, P. Bhattacharya, and R. S. Katiyar, Mater. Sci. Eng., B103, 9 (2003) [DOI: 10.1016/s0921-5107(03)00127-2].
  11. V. Musat, B. Teixeira, E. Fortunato, R. C. C. Monteiro, and P.Vilarinho, Surf. Coat. Technol. 180-181, 659 (2004) [DOI: 10.1016/j.surfcoat.2003.10.112].
  12. A. N. Banerjee, C. K. Ghosh, K. K. Chattopadhyay, H. Minoura, A.K. Sarkar, A. Akiba, A. Kamiya, and T. Endo, Thin Solid Films 496,112 (2006) [DOI: 10.1016/j.tsf. 2005.08.258].
  13. A. Geivandov, I. Kasianova, E. Kharatiyan, A. Lazarev, P. Lazarev, and S. Palto, EuroDisplay Digest (Moscow, Russia 2007 Aug. 17-20, Crysoptix, KK.) p. 26.
  14. W. L. Bragg and W. H. Bragg, The Crystalline State (McMillan, New York, 1933) p. 189.

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