References
- Wells, O. C. and Bremer, C. G., 1968, "Voltage measurement in the scanning electron microscope," Journal of Physics E, Vol. 1, pp. 902-906.
- Jeol, A Guide to Scanning Microscope Observation, Jeol, Japan, pp. 4-35.
- Lim, S. J., Lee, C. H., and Kang. J. H., 2005, "Development of Controller for Optimal Beam Scanning in E-Beam Manufacture System," Proceeding of the KSPE 2005 fall annual conference, pp. 166-169.
- Lee, S. U., Jeon, J. U., and Han., S. H. 2004, "The Electron Detector in Scanning Electron Microscope," Proceeding of the KSMTE 2004 spring annual conference, pp. 513-517.
- Kim, S. J., Kim, D. H., Park, M. J., Oh, S. K., and Jang, D. Y., 2008, "Controller Circuit analysis and Scan Generation modulation for enhancing SEM image," Proceeding of the KSMTE 2008 spring annual conference, pp. 108-111.
- Kim, D. H., Kim, Y. D., Park, M. J., and Jang, D. Y., 2007, "Methodologies for enhancing resolution a scanning electron microscopy," Proceeding of the KSMTE 2007 spring annual conference, pp. 80-83.
- Lee, K. W. and Thong, J. T. L., 1999, "Improving the speed of scanning electron microscope deflection system," Measurement Science and Technology, Vol. 10, pp. 1070-1074.
- Kim, D. H., Kim, S. J., Park, M. J., Oh, S. K., and Jang, D. Y., 2008, "Methodologies for enhancing performance of Scan drivers in a Scanning electron Microscope," Proceeding of the KSME 2008 spring annual conference, pp. 22-23.
- Song, D. Y., Lee, S. H., Jung, T. U., Cho, S. E., Park, S. J., and Kim, D. O., 2008, "Development of Back-emf Filter Circuit for Driving Sensorless BLDC Motors," The Korean Institute of Power Electronics, Vol. 13, No. 1, pp. 63-69.
- Pluska, M. Ratajczak and Katcki, J. J., 2006, "Elimination of scanning electron microscopy image periodic distortions with digital signal processing methods," Journal of Microscopy, Vol. 224, pp. 82-92.