References
- G. Binnig, C. F. Quate and Ch. Gerber, 'Atomic force microscope,' Phys. Rev. Lett., Vol. 56, pp. 930-933, (1986) https://doi.org/10.1103/PhysRevLett.56.930
- G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, 'Tunneling through a controllable vacuum gap,' Appl. Phys. Lett., Vol. 40, pp. 178-180, (1982) https://doi.org/10.1063/1.92999
- F. Ohnesorge and G. Binnig, 'True atomic resolution by atomic force microscopy through repulsive and attractive forces,' Science, Vol. 260, pp. 1451-1456, (1993) https://doi.org/10.1126/science.260.5113.1451
- I. L. Singer, 'Friction and energy dissipation at the atomic scale: A review,' J. Vac. Sci. Technol. A, Vol. 12, pp. 2605-2616 (1994) https://doi.org/10.1116/1.579079
- A A Tseng, A Notargiacomo, and T. P. Chen, 'Nanofabrication by scanning probe microscope lithography: A review,' J. Vac. Sci. Technol. B, Vol. 23, pp. 877-894, (2005) https://doi.org/10.1116/1.1926293
- S. H. Wang, G. Xu and S. L. Tan, 'Development of a metrological atomic force microscope for nano-scale standards calibration,' Proc. of SPIE Vol. 7155, pp. 715501-1- 715501-8, (2008) https://doi.org/10.1117/12.817278
- H.-J. Butt, B. Cappella and M. Kappl, 'Force measurements with the atomic force microscope: Technique, interpretation and applications,' Surf. Sci. Rep., Vol. 59, pp. 1-152, (2005) https://doi.org/10.1016/j.surfrep.2005.08.003
- J. H. Kim and K-B. Song, 'Recent progress of nano-technology with NSOM,' Micron, Vol. 38, pp. 409-426, (2007) https://doi.org/10.1016/j.micron.2006.06.010
- E. Chilla, T. HesjedahI and H-J Frohlich, 'Nanoscale determination of phase velocity by scanning acoustic force microscopy,' Phys. Rev. B, Vol. 55, pp. 15852-15855, (1997) https://doi.org/10.1103/PhysRevB.55.15852
- U. Rabe and W. Arnold, 'Acoustic microscopy by atomic force microscopy,' Appl. Phys. Lett., Vol. 64, pp. 1493-1495, (1994) https://doi.org/10.1063/1.111869
- K Yamanaka and S. Nakano, 'Ultrasonic atomic force microscope with overtone excitation of cantilever,' Jpn. J. Appl. Phys., Vol. 35, pp. 3787-3792, (1996) https://doi.org/10.1143/JJAP.35.3787
- W. Rohrbeck and E. Chilla, 'Detection of surface acoustic waves by scanning force microscopy,' Phys. Stat. Sol. (a), Vol. 131, pp. 69-71, (1992) https://doi.org/10.1002/pssa.2211310111
- M. Salmeron, G. Nuebauer, A Folch, M. Tomitori, D. F. Ogletree and P. Sautet, 'Viscoelastic and electrical properties of self-assembled monolayers on gold (111) films,' Langmuir, Vol. 9, pp. 3600-3611, (1993) https://doi.org/10.1021/la00036a041
- S. N. Magonov, V. Elings and M. -H, Whangbo, 'Phase imaging and stiffness in tapping-mode atomic force microscopy,' Surf. Sci. Lett., Vol. 375, pp. L385-L391, (1997) https://doi.org/10.1016/S0039-6028(96)01591-9
- C. Miyasaka, B. R Tittmann, T. Adachi and A Yamaji, 'Theoretical approach to contrast mechanism for UAFM," PVP-2002, ASME conf., Vol. 450, pp. 63-67, (2002)
- Y. Martin, C. C. Williams, and H. K Wickramasinghe, 'Atomic force microscopeforce mapping and profiling on a sub 100-A scale,' J. Appl. Phys., Vol. 61, pp. 4723-4729, (1987) https://doi.org/10.1063/1.338807