References
- S. Ovshinsky. "Reversible Electrical Switching Phenomena in Disordered Structures". Phys. Rev. Lett., Vol.21(20), p. 1450. 1968 https://doi.org/10.1103/PhysRevLett.21.1450
- S.H.Lee, Y.N.Hwang, S.Y.Lee, K.C.Ryoo, S.J.Ahn, H.C.Koo, W.C.Jeong, YT.Kim, G.H.Koh, G.T.Jeong, H.S.Jeong and Kinam Kim. "Full Integration and Cell Characteristics for 64Mb non-volatile PRAM". IEEE Symposium on VLSI Tech. Dig., pp. 20-21. 2004
- S.Y. Lee, K.j. Choi, S.O. Ryu, S.M. Yoon, N.Y Lee, Y.S. Park, S.H. Lee and B.G. Yu. "Polycrystalline silicon germanium heating layer for phase-change memory application". Applied Physic Letter. Vol.89, pp. 053517-1-3, 2006 https://doi.org/10.1063/1.2335363
- Y.H.Ha, J.H.Yi, H.Horii, J.H.Park, S.H.Joo, S.O.Park, V.L.Chung, J.T.Moon. "An Edge Contact Type Cell for Phase Change RAM Featuring Very Low Power Consumption" IEEE Symposium on VLSI Tech. Dig., pp. 175-176, 2003
- Y.N.Hwang, S.H.Lee, S.J.Ahn, S.Y.Lee, K.C.Ryoo, H.S. Hong, H.C. Koo, F. Yeung, J.H. Oh, H.J. Kim, W.C.Jeong, J.H Park, H. Horii, YH. Ha, J.H. Yi, G.H. Koh, G.T.Jeong, H.S.Jeong and Kinam Kim, "Writing current reduction for high-density phase change RAM", IEDM 03, pp. 893-896, 2003
-
I. Friedrich, V. Weidenhof. W. Njoroge, P. Franz, M.Wuttig, "Structural transformation of
$Ge_2Sb_2Te_5$ films studied by electrical resistance measurements", J. Appl. Phys., Vol.87, No.9, p. 4130, 2000 https://doi.org/10.1063/1.373041
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