ETRI Journal

Electronics and Telecommunications Research Institute (한국전자통신연구원)
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An Effective Test and Diagnosis Algorithm for Dual-Port Memories

  • Park, Young-Kyu (Department of Electical & Electronic Engineering, Yonsei University) ;
  • Yang, Myung-Hoon (Department of Electical & Electronic Engineering, Yonsei University) ;
  • Kim, Yong-Joon (Department of Electical & Electronic Engineering, Yonsei University) ;
  • Lee, Dae-Yeal (Department of Electical & Electronic Engineering, Yonsei University) ;
  • Kang, Sung-Ho (Department of Electical & Electronic Engineering, Yonsei University)
  • Received : 2007.11.20
  • Accepted : 2008.06.27
  • Published : 2008.08.30
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Abstract

This paper proposes a test algorithm that can detect and diagnose all the faults occurring in dual-port memories that can be accessed simultaneously through two ports. In this paper, we develop a new diagnosis algorithm that classifies faults in detail when they are detected while the test process is being developed. The algorithm is particularly efficient because it uses information that can be obtained by test results as well as results using an additional diagnosis pattern. The algorithm can also diagnose various fault models for dual-port memories.

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