References
- H. Kishi, Y. Mizuno and H. Chazono, Jpn. J. Appl. Phys., 42(1), 1 (2003) https://doi.org/10.1143/JJAP.42.1
- M. Randall, in proceedings of the CARTS USA 2000 symposium (Huntington Beach, CA, March, 2000), 195 (2000)
- Y. Sakabe, Y. Takeshima and K. Tanaka, J. Electroceram., 3, 115 (1999) https://doi.org/10.1023/A:1009986825169
- S. Mustofa, T. Araki, T. Furusawa, M. Nishida and T. Hino, Mater. Sci. and Eng., B103, 128 (2003) https://doi.org/10.1016/S0921-5107(03)00160-0
- Y. Sakabe, Ceramics (in Japan), 36, 407 (2001)
- P. C. Joshi and S. B. Desu, Thin Solid Films, 300, 289 (1997) https://doi.org/10.1016/S0040-6090(96)09468-0
- S. Markovic, M. Mitric, N. Cvjeticanin and D Uskokovic, J. Eur. Ceram. Soc., 27, 505 (2007) https://doi.org/10.1016/j.jeurceramsoc.2006.04.066
- R. Steinhausen, A. Kouvatov, H. Beige, H. T. Langhammer and H. P. Abicht, J. Eur. Ceram. Soc., 24, 1677 (2004) https://doi.org/10.1016/S0955-2219(03)00496-5
- V. Mueller, L. Jager, H. Beige, H. P. Abicht and T. Muller, Solid State Commun., 129, 757 (2004) https://doi.org/10.1016/j.ssc.2003.12.035
- R. A. Zarate, A. L. Kabrera, U. G. Volkman and V. Fuenzalida, J. Phys. Chem. Solids, 59, 1639 (1998) https://doi.org/10.1016/S0022-3697(98)00008-0
- A. E. Feuersanger, A. K. Hagenlocher and A. L. Solomon, J. Electrochem. Soc., 111, 1387 (1964) https://doi.org/10.1149/1.2426011
- S. S. Park, J. H. Ha and H. N. Wadley, Integrated Ferroelectrics, 99, 105 (2008) https://doi.org/10.1080/10584580802107809
- S. W. Ding, J. Chai and C. Y. Feng, Mater. Lett., 60, 3241 (2006) https://doi.org/10.1016/j.matlet.2006.02.087
- W. Bak, C. Kajtoch and F. Starzyk, Mater. Sci. Eng., B100, 9 (2003) https://doi.org/10.1016/S0921-5107(02)00578-0
- C. Kajtoch, Mater. Sci. Eng., B64, 25 (2003) https://doi.org/10.1016/S0921-5107(99)00138-5
- A. Kumar, B. P. Singh, R. N. P. Choudhary and A. K. Thakur, Mater. Lett., 59, 1880 (2005) https://doi.org/10.1016/j.matlet.2005.02.004
- G. W. Dietz, M. Schumacher, R. Waser, S. K. Streiffer, C. Basceri and A. I. Kingon, J. Appl. Phys., 82, 2359 (1997) https://doi.org/10.1063/1.366045
- Z. Wei, M. Noda and M. Okuyama, Jpn. J. Appl. Phys., 41, 6619 (2002) https://doi.org/10.1143/JJAP.41.6619
- N. Shu, Ashok Kumar, M. R. Alam, H. L. Chan and Q. You, Appl. Surf. Sci., 109, 366 (1997) https://doi.org/10.1016/S0169-4332(96)00676-9