References
- J. T. Wescotta, P. Kung, and A. Maitia, Appl. Phys. Lett., 90, 033116 (2007). https://doi.org/10.1063/1.2432237
- J. Xiong, Z. Zheng, X. Qin, M. Li, H. Li, and X. Wang, Carbon, 44, 2701 (2006). https://doi.org/10.1016/j.carbon.2006.04.005
- E. Kymakis and G. A. J. Amaratunga, J. Appl. Phys., 99, 084302 (2006). https://doi.org/10.1063/1.2189931
- Y. Qiao, C. M. Li, S. J. Bao, and Q. L. Bao, J. Power Sources, 170, 79 (2007). https://doi.org/10.1016/j.jpowsour.2007.03.048
- Y. H. Liu, B. Yi, Z. G. Shao, L. Wang, D. Xing, and H. Zhang, J. Power Sources, 163, 807 (2007). https://doi.org/10.1016/j.jpowsour.2006.09.065
- B. Philip, J. K. Abraham, A. Chandrasekhar, and V. K. Varadan, Smart Mater. Struct., 12, 935 (2003). https://doi.org/10.1088/0964-1726/12/6/010
- H. W. Chen, R. J. Wu, K. H. Chan, Y. L. Sun, and P. G. Su, Sens. Actuator B-Chem., 104, 80 (2005). https://doi.org/10.1016/j.snb.2004.04.105
- U. Yogeswaran and S. M. Chen, Electrochim. Acta, 52, 5985 (2007). https://doi.org/10.1016/j.electacta.2007.03.047
- A. D. Pasquier, H. E. Unalan, A. Kanwal, S. Miller, and M. Chhowalla, Appl. Phys. Lett., 87, 203511 (2005). https://doi.org/10.1063/1.2132065
- N. Li, Y. Huang, F. Du, X. He, X. Lin, H. Gao, Y. Ma, F. Li, Y. Chen, and P. C. Eklund, Nano Lett., 6, 1141 (2006). https://doi.org/10.1021/nl0602589
- Y. Yang, M. C. Gupta, K. L. Dudley, and R. W. Lawrence, Nano Lett., 5, 2131 (2005). https://doi.org/10.1021/nl051375r
- X. Zhou, Y. Zhu, Q. Gong, and J. Liang, Mater. Lett., 60, 3769 (2006). https://doi.org/10.1016/j.matlet.2006.03.147
- Y. Wang, R. Cheng, L. Liang, and Y. Wang, Compos. Sci. Technol., 65, 793 (2005). https://doi.org/10.1016/j.compscitech.2004.10.012
- X. Zhang, J. Zhang, and Z. Liu, Carbon, 43, 2186 (2005). https://doi.org/10.1016/j.carbon.2005.03.034
- X. Gong, J. Liu, S. Baskaran, R. D. Voise, and J. S. Young, Chem. Mater., 12, 1049 (2000). https://doi.org/10.1021/cm9906396
- B. Kim and W. M. Sigmund, Langmuir, 20, 8239 (2004). https://doi.org/10.1021/la049424n
- Z. Shi, Y. Lian, X. Zhou, Z. Gu, Y. Zhang, S. Iijima, Q. Gong, H. Li, and S. L. Zhang, Chem. Commun., 6, 461 (2000).
- J. W. Kim and K. D. Suh, Colloid Polym. Sci., 276, 870 (1998). https://doi.org/10.1007/s003960050323
- Y. Yang, Y. Chu, F. Yang, and Y. Zhang, Mater. Chem. Phys., 92, 164 (2005). https://doi.org/10.1016/j.matchemphys.2005.01.007
- S. J. Han, B. Kim, and K. D. Suh, Macromol. Chem. Phys., 208, 377 (2007). https://doi.org/10.1002/macp.200600410
- Y. K. Hong, C. Y. Lee, C. K. Jeong, D. E. Lee, K. Kim, and J. Joo, Rev. Sci. Instrum., 74, 1098 (2003). https://doi.org/10.1063/1.1532540
- N. F. Colaneri and L. W. Shacklette, IEEE Trans. Instrum. Meas., 41, 291 (1992). https://doi.org/10.1109/19.137363
- H. M. Kim, K. Kim, C. Y. Lee, J. Joo, H. S. Yoon, D. A. Pejakovic, J. W. Yoo, and A. J. Epstein, Appl. Phys. Lett., 84, 589 (2004). https://doi.org/10.1063/1.1641167