References
- Kasikov, A.; Aarik, J.; Mandar, H.; Moppel, M.; Pars, M.; Uustare, T. J. Phys. D: Appl. Phys. 2006, 39, 54 https://doi.org/10.1088/0022-3727/39/1/010
- Tang, H.; Prasad, K.; Sanjines, R.; Schmid, P. E.; Levy, F. J. Appl. Phys. 1994, 75, 2042 https://doi.org/10.1063/1.356306
- Dannenberg, R.; Greene, P. Thin Solid Films 2000, 360, 122 https://doi.org/10.1016/S0040-6090(99)00938-4
- Rodrigues, J.; Gomez, M.; Ederth, J.; Niklasson, G. A.; Granqvist, C. G. Thin Solid Films 2000, 365, 119 https://doi.org/10.1016/S0040-6090(99)01109-8
- Mitchell, D. R. G.; Attard, D. J.; Finnie, K. S.; Triani, G.; Barbe, C. J.; Depagne, C.; Barlett, J. R. Appl. Surf. Sci. 2005, 243, 265 https://doi.org/10.1016/j.apsusc.2004.09.070
- Zaitsu, S.; Motokoshi, S.; Jitsuno, S.; Nakatsuka, M.; Yamanaka, T. Japan J. Appl. Phys. 2002, 41, 160 https://doi.org/10.1143/JJAP.41.160
- Aarik, J.; Aidla, A.; Mandar, H.; Uustare, T.; Schuisky, T.; Harsta, A. J. Cryst. Growth 2002, 242, 189 https://doi.org/10.1016/S0022-0248(02)01426-4
- Linsebigler, A. L.; Lu, G.; Yates Jr., J. T. Chem. Rev. 1995, 95, 735 https://doi.org/10.1021/cr00035a013
- Hoffman, H.; Martin, S.; Choi, W.; Bahnemann, D. Chem. Rev. 1995, 95, 69 https://doi.org/10.1021/cr00033a004
- Diebold, U. Surf. Sci. Rep. 2003, 48, 53 https://doi.org/10.1016/S0167-5729(02)00100-0
- Yan, Y.; Chaudhuri, S. R.; Chen, D.-G.; Sarkar, A. Chem. Mater. 1996, 7, 2007 https://doi.org/10.1021/cm00059a006
- Chrysicopoulou, P.; Davazoglou, D.; Trapalis, C.; Kordas, G. Thin Solid Films 1998, 323, 188 https://doi.org/10.1016/S0040-6090(97)01018-3
- Trapalis, C. C.; Keivanidis, P.; Kordas, G.; Zaharescu, M.; Crisan, M.; Szatvanyi, A.; Gartner, M. Thin Solid Films 2003, 433, 186 https://doi.org/10.1016/S0040-6090(03)00331-6
- Trapalis, C.; Gartner, M., Kordas, G.; Anastasescu, M.; Zaharescu, M.; Modreanu, M. Appl. Surf. Sci. (in press)
- Bruggeman, D. G. A. Ann. Phys. (Leipzig) 1935, 24, 636
- Fujii, T.; De Groot, F. M. F.; Sawatzky, G. A. Phys. Rev. B 1999, 59, 3195 https://doi.org/10.1103/PhysRevB.59.3195
- Handbook of X-Ray Photoelectron Spectroscopy; Muilenberg, G. E., Ed.; Perkin-Elmer Corporation: Minnesota, 1979
- Wang, L.; Luo, J.; Fan, Q.; Suzuki, M.; Suzuki, I. S.; Engelhard, M. H.; Lin, Y.; Kim, N.; Wang, J. Q.; Zhong, C.-J. J. Phys. Chem. B 2005, 109, 21593 https://doi.org/10.1021/jp0543429
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