DOI QR코드

DOI QR Code

Effect of the Surface Oxidation on the Electromagnetic Wave Absorption Behavior of a Fe-based Nanocrystalline Alloy

Fe계 나노결정립 분말의 표면 산화에 따른 전자파 흡수특성

  • Koo, S.K. (School of Nano Engineering, Inje University) ;
  • Woo, S.J. (School of Nano Engineering, Inje University) ;
  • Moon, B.G. (Advanced Materials Research Division, Korea Institute of Materials Science) ;
  • Song, Y.S. (Research Institute, Amosense Co.) ;
  • Park, W.W. (School of Nano Engineering, Inje University) ;
  • Sohn, K.Y. (School of Nano Engineering, Inje University)
  • Published : 2007.10.28

Abstract

The oxidation of $Fe_{73}Si_{16}B_7Nb_3Cu_1$ nanocrystalline powder has been conducted to investigate its influence on the electromagnetic wave absorption characteristics of the soft magnetic material. Oxidation occurred primarily on the surface of nanocrystals. Oxidation reduced the real part of complex permeability due to the reduction of the relative volume of the powder, which otherwise contributes to the permeability. Oxidation reduced the absorption efficiency of the sheet at frequencies over 1GHz, indicating that the relative contribution of skin depth increments to the absorption was not significant. The pulverization and milling process lowered the optimum crystallization temperature of the material by $40{\sim}50^{\circ}C$ because of the internal energy accumulated during the fragmentation and powder thinning processes.

Keywords

References

  1. J. R. Liu, M. Hoh, T. Horikawa, M. Itakura, N. Kuwano and K. Machida: J. Appl. Phys., 37 (2004) 2737
  2. D. S. Li, T. H. Horikawa, J. R. Liu, M. Itoh and K. Machida: J. Alloys Compd., 408-412 (2006) 1429 https://doi.org/10.1016/j.jallcom.2005.04.109
  3. H. J. Cho, E. K. Cho, Y. S. Song, S. K. Kwon, K. Y. Sohn and W. W. Park: Mater. Sci. Forum, 534-536 (2007) 1345 https://doi.org/10.4028/www.scientific.net/MSF.534-536.1345
  4. R. Dosoudil, M. Usakova, J. Franek, J. Slama and V. Olah: J. Magn. Magn. Mater., 304 (2006) 755 https://doi.org/10.1016/j.jmmm.2006.02.216
  5. G. Herzer: IEEE Trans. Mag., 26 (1990) 1379 https://doi.org/10.1109/20.104389
  6. http://cp.literature.agilent.com/litweb/pdf/5965-7917E.pdf, Agilent Technical Report No.5965-7917E
  7. A. Hosoe, K. Nitta, S. Inazawa, K. Yamada, T. Yoshisaka and K. Ikeda: SEI Tech. Rev., 54 (2002) 20
  8. Y. Yoshizawa, S. Oguma and K. Yamauchi: J. Appl. phys., 64 (1988) 6044 https://doi.org/10.1063/1.342149