UV 경화기술의 산업적 응용

  • 장진호 (금오공과대학교 신소재시스템공학부 섬유패션공학) ;
  • 구광회 (금오공과대학교 신소재시스템공학부 섬유패션공학)
  • Published : 2007.08.13

Abstract

Keywords

References

  1. A De Raeve, "Proc. RadTech Europe", Barcelona, 2005
  2. R S Davidson and R J Holman, Rev. Prog. Color., 33, 52(2003)
  3. D Eddowes, Polym. Paint Col. J, (Jul), 12(2001)
  4. S Mihno. Ink World(Jul), 20(2001)
  5. A J Bean, RadTech Rep., 16(2), 20(2002)
  6. D Savastano, RadTech Rep., 16(4), 57(2002)
  7. K J Ven Den Berg. H Klinkenberg and A Noomen, WO. Pat. 9947617(2003)
  8. F J A D Bakkeren, R P Klassen and A J H Lansbergen, EP. Pat. 1048706(2000)
  9. M D Latunski, RadTech Rep., 16(4), 76(2002)
  10. D H Biro, RadTech Rep., 16(2), 22(2002)
  11. D Savastano, Ink World(Jul), 26(2002)
  12. V J Cahill, RadTech Rep., 15(4), 20(2001)
  13. A Hudd, "Proc. Paint Res. Assoc. Conf. Materials and Markets", Stockport, 2002
  14. H Noguchi and M Shimomura, RadTech Rep., 15(2), 22(2001)
  15. J D Roth, US. Pat. 5889048(1999)
  16. M P Secord and R C Woudenberg, WO. Pat. 0049097(2000)
  17. J E Fleischer, RadTech Rep., 14(6), 48(2000)
  18. J K Braddock, RadTech Rep., 16(4), 13(2002)
  19. M Kunz and M Bauer, RadTech Rep., 14(6), 34(2000)
  20. S Presutto, Screen Printing(Jun), 68(2001)
  21. J Whelan, "Proc. RadTech North Amer.", Indianapolis, p.627, 2002
  22. J Prieto, Polym. Paint Col. J. (Jul), 15(2001)
  23. M Visconti, M Cattaneo and G Li Bassi, "Proc. RadTech North Amer.", Chicago, p.28, 1998
  24. J A Arceneaux, J-P Bleus, A Corley, L Lindekens, T Moorehead and Z J Wang, "Proc. RadTech North Amer.", Chicago, p.235, 1998
  25. J Wekard, W Fischer, E Luhmann and D Rappen, "Proc. 6th Congress Creative Adv. Coat. Technol.", Nuremberg, 2001
  26. R Awad and F Lunzer, "Proc. RadTech Eur.", Basle, p.415, 2001
  27. M Burglin, M Kohler, K Dietliker, J-P Wolf. I Gatlik, G Gescheidt, D Neshchadin and G rist, "Proc. RadTech North Amer.", Baltimore, p.577, 2000
  28. A Valet and C Decker, RadTech Rep., 14(6), 40(2000)
  29. S Friebel, Eur. Coat. J., 1-2, 68(2001)
  30. E Krendlinger, H Ehrhardt, F-L Heinrichs and H Endres, Eur. Coat. J., 5, 32(2002)
  31. S Frahn, V Valter and G Leder, "6th Congress Creative Adv. Coat. Technol.", Nuremberg, 2001
  32. M Strid, H Bolm and V Rekowski, "Proc. RadTech Eur.", Basle, p.95, 2001
  33. M M G Antonisse, P H G Binda and S Udding-Louwrier, Amer. Ink Maker(May), (2001) 22
  34. M M G Antonisse, R A Baijards, W H Kaptijn and S Udding-Louwrier, Eur. Coat. J., 10, 32(2001)
  35. C Kuhne and H Laver, "Proc. RadTech Eur.", Basle, p.87, 2001
  36. M Resinger and C Rickert, "Proc. RadTech Eur.", Basle, p.101, 2001
  37. S Padaki and R Buehner, "Proc. RadTech North Amer.", Baltimore, p.698, 2000
  38. C Zune and K Buysens, Eur. Coat. J., 5, 18(2000)
  39. S Udding-Louwrier, R A Baijards, E Sjoerd de Jong and P H G Binda, "Proc. Rad- Tech North Am.", Baltimore, p.650, 2000
  40. R Jahn, H Laver and C te Walvaart, Polym. Paint Col. J., May, 16(2000)
  41. Z Jovanovic, J Lahaye, H Laver, S Megert and C te Walvaart, Polym. paint Col, J., Jul, 8(2000)
  42. K Blatter, M Strid, O Thiele and F Zimmermann, Eur. Coat. J., 10, 24(2000)
  43. R Blum, R Schwalm and O Stephan, WO. Pat. 0157149(2001)
  44. P Mills, RadTech Rep., 11(6), 16(1997)
  45. P Mills, "Proc. RadTech Eur.", Basle, p.65, 2001
  46. M Scheiber and H Braun, RadTech Rep., 11(2), 19(1997)
  47. D J Gaber, RadTech Rep., 11(2), 22(1997)
  48. C Bachmann and C Cantor, Adhes. Age, 42(4), 24(1999)
  49. J A Dougherty, J McKittrick and G S Russell, "Proc. RadTech North Am.", Baltimore, p.65, 1998
  50. P Spillane, Adhes. Age, Mar, 36(1995)
  51. K Rhodes, RadTech Rep., 14(4), 33(2000)
  52. J T Whelan and J F Taylor, RadTech Rep., 14(2), 15(2000)
  53. D Skinner, "Proc. RadTech North Amer.", Faltimore, p.140, 1998
  54. V V Krongauz and C P Chawta, RadTech Rep., 15(5), 34(2001)
  55. S Helity and N Gager, "Proc. RadTech Eur.", Berlin. p.489, 1999
  56. C W G Ansell. S J Masters and E J Millan, J. Appl. Polym. Sci., 81, 3321(2001) https://doi.org/10.1002/app.1788
  57. R A Chiversand I Webster, "Proc Conf. Adhes. 99 Cambridge", UK, p.37, 1999
  58. I Webster, Int. J. Adhes., 19(1), 29(1999) https://doi.org/10.1016/S0143-7496(98)00054-2
  59. M Scheiber and H Braun, RadTech Rep., 11(2), 19(1997)
  60. A Dobner, Adhes. Technol., 17(2), 14(2000)
  61. KSchumacker, U Dussterwald and R Fink, Adhes. Technol., 17(2), 18(2000)
  62. H Smith, Adhes. Age. 42(12), 38(1999)
  63. E-J Gerard and J Schneider, "Proc. RadTech Eur.", Lyon, p.175, 1997
  64. R P Eckberg and M Krenceski, "Proc. RadTech North Amer.", Chicago, p.530, 1998
  65. W A Martin, J P Adams, K Bjerre, S Christensen, T Kindt Larsen, C W Walker, W D Tsu-Fang, M Widham and S C Pegram, US. Pat. 5981618(1999)
  66. Y Zhang, C-Y Won and C-C Chu, J. Polym. Sci., Part A: Polym. Chem., 37, 4554(1999) https://doi.org/10.1002/(SICI)1099-0518(19991215)37:24<4554::AID-POLA13>3.0.CO;2-T
  67. Y Fhang, C-Y Won, and C-C Chu, J. Polym. Sci., Part A: Polym. Chem., 38, 2392(2000) https://doi.org/10.1002/1099-0518(20000701)38:13<2392::AID-POLA120>3.0.CO;2-P
  68. A S Sawhney and J A Hubbell, RadTech Rep., 15(3), 14(2001)
  69. G John and M Mortia, Macromolecules, 32, 1853(1999) https://doi.org/10.1021/ma981729j
  70. K S Anseth and D J Quick, Macromol. Rapid Commun., 22, 564(2001) https://doi.org/10.1002/1521-3927(20010501)22:8<564::AID-MARC564>3.0.CO;2-S
  71. S Bryant, P Martens, J Elisseeff, M Randolph, R Langer and K S Anseth, in Wiley Polymer Networks Review, Eds B T Stokke and A Elsaeter, 2, 395(1999)
  72. R J Russell, A C Axel, K L Shields and M V Pishko, Polymer, 42, 4893(2001) https://doi.org/10.1016/S0032-3861(00)00851-X
  73. A Laschewsky, O Ouari, C Mangenet and L jullien, Macromol. Symp., 164, 323(2001)
  74. O Prucker, K Muller and J Ruhe, Mater. Res. Symp., 629, FF9.8.1-9.8.6(2000)
  75. T M Shah, US Pat. 6291543(2001)
  76. W W Shen, W Knoll and C W Frank, Polym. Mater. Sci. Eng., 84, 400(2000)
  77. D Kuckling, I G Ivanova, H-J PAdler, K-F Arndt and T Wolff, Polym., 41(1), 714(2000)
  78. L Liang, X Feng, L Peurrung and V Viswanathan, J. Membr. Sci., 162, 235(1999) https://doi.org/10.1016/S0376-7388(99)00145-3
  79. C Vu, A Eranian, C Fraurent, P Noireaux and J Deveau, "Proc. RadTech Eur.", Berlin, p.523, 1999
  80. C Vu, C Faurent, V Elango, A Eranian, P Vincent, D Wihelm, P Noireaux, J Deveau, F Oudet and F Nadaud, "Proc. RadTech North Amer.", Baltmore, p.822, 2000
  81. C Vu, O LeFerte and A Eranian, "Proc. RadTech Eur.", Basle, p.621, 2001
  82. M Menning, P W Oliverira, A Frantzen and H Schmidt, Thin Solid Film, 351, 225(1999) https://doi.org/10.1016/S0040-6090(99)00340-5
  83. D Blanc, S Pelissier, K Saravanaumuttu, S I Nazafi and M P Anderews, Adv. Mater., 11, 1508(1999) https://doi.org/10.1002/(SICI)1521-4095(199912)11:18<1508::AID-ADMA1508>3.0.CO;2-V
  84. W Huimin, M Minghua, J Yongcia, L Qingshan, Z Xiaohong and W Shikang, Polym. Int., 51, 7(2001)
  85. K Zahouily, S Benfarhi, T Bendaikha, J Baron and C Decker, "Proc. RadTech Eur.", Basle, p.583, 2001
  86. G Wurtz, R Bachelot, F H'Dhili, P Royer, C Triger. C Ecoffet and D-J Lougnot, Jpn. J. Appl. Phys., 39, L98(2000) https://doi.org/10.1143/JJAP.39.L98
  87. D L Gin, D H Gray, R C Smith, H Deng, E Kim, E Juang and B C Baxter, Polym. Mater. Sci. Eng., 80, 5(1999)
  88. D H Gray, E Juang, H Deng, D L Gin and K B Schwarz, Polym. Prepr., 40(1), 429(1999) https://doi.org/10.1016/S0032-3861(98)00241-9
  89. J H Ding and D L Gin, Chem. Mater., 12, 22(2000) https://doi.org/10.1021/cm990603d
  90. R S Underhill and G Liu, Polym. Mater. Sci. Eng., 83, 557(2000)
  91. F Henselwood and G Liu, Macromolecules, 31, 4213(1998) https://doi.org/10.1021/ma9802327
  92. G Liu, L Qiao, and A Guo, Macromolecules, 29, 5508(1996) https://doi.org/10.1021/ma9604653
  93. S Luetke, RadTech Rep., 10(2), 29(1996)
  94. A Gupta, RadTech Rep., 10(2), 30(1996)
  95. J M Jethmalani, D M Schwartz, Polym. Prepr., 40(2), 271(1999)
  96. J D Roth, US. Pat. 5889084 (1999)
  97. M B Sponsler, The Spectrum, 13, 37(2000)
  98. Y Ohe, H Ito, N Watanabe and K Ichimura, J. Appl. Polym. Sci., 77, 2189(2000) https://doi.org/10.1002/1097-4628(20000906)77:10<2189::AID-APP12>3.0.CO;2-U
  99. L R LindvoldJ Stensborg and T Rasmusson, RadTech Rep., 15(3), 31(2001)
  100. C Pitois. S Vukmirovic, A Hult, D Weisman and M Robertsson, Macromolecules, 32, 2903(1999) https://doi.org/10.1021/ma981057x
  101. T Braig, M S Bayer, O Nuyken, D C Muller, M Gross and K Meerholz, Polym. Mater. Sci. Eng., 80, 122(1999)
  102. C Decker and T Bendaikha, J. Appl. Polym. Sci., 70, 2269(1998) https://doi.org/10.1002/(SICI)1097-4628(19981212)70:11<2269::AID-APP21>3.0.CO;2-D
  103. C E Hoyle, J B Whitehead, N L Gill, M L Hladik and W Kuang, Polym. Mater. Sci. Eng., 82, 336(2000)
  104. K Kawatsuki, I Sai and T Yamamoto, J. Polym. Sci., Part A: Polym. Chem., 37, 4000(1999) https://doi.org/10.1002/(SICI)1099-0518(19991101)37:21<4000::AID-POLA14>3.0.CO;2-W
  105. B Sapich, J Stumpe, T Krawinkel and H R Kricheldorf, Macromolecules, 31, 1016(1998) https://doi.org/10.1021/ma971027e
  106. J Stumpe, H R Kricheldorf, A Fritz and A Schonhals, Macromolecules, 34, 5694(2001) https://doi.org/10.1021/ma001616b
  107. H Hattori and T Uryu, Liq. Cryst., 28, 25(2001) https://doi.org/10.1080/026782901462346
  108. V P Shibaev, A Y Bobrovsky and N Boiko, Macromol. Symp., 174, 319(2001)
  109. D J Broer, J A M Haaren and J Lub, Proc. SPIE. 4107, 59(2000)
  110. C Morgan, G S Chen, C Boothroyd, S Bailey and C Humphreys, Phys. World, 28(1992)
  111. R R Dammel, J-B Bae, W-K Kim, T Kudo, D McKenzie, M Padmanaban and M D Rahman, Polym. Mater. Sci. Eng., 84, 283(2001)
  112. V Q Pham, G L Weilbel, A H Hamad and C K Ober, Polym. Mater. Sci. Eng., 84, 49(2001) https://doi.org/10.1016/S0921-5107(01)00568-2
  113. H V Tran, R J hung, D A Loy, D R Wheeler, J Byers, W Conley and C G Wilson, Polym. Mater. Sci. Eng., 84, 213(2001)
  114. D C Tully, A R Trimble and J M Frechet, Polym. Prepr., 41(1), 142(2000)
  115. T Hayakawa, J Wang, N Sundararajan, M Xiang, X Li, B Glusen, M Ueda and C K Ober, Polym. Prepr., 41(1), 486(1999)
  116. S-Y Moon, J. Appl. Polym. Sci., 81(2001) 3399 https://doi.org/10.1002/app.1796
  117. S N Kim, S C Shim, D Y Kim, Y H Rhee and Y B Kim, Macromol. Rapid Commun., 22(13), 1067(2001)
  118. T Schmitt, P Goldman and G Orosz, RadTech Rep., 15(2), 16(2001)
  119. B Persson, RadTech Rep., 15(3), 28(2001)
  120. K Ohtani, T Yamamoto, H Sendai, T Kadota, S Sugita, H Kamata and T Watanabe, EP. Pat. 0922727(1999)
  121. T Jung, M Koehler and D Wostratzky, Soc. Advancement Mater. Process Eng. J., 34(4), 40(1998)
  122. R McCartney, RadTech Rep., 15(3), 20(2001)
  123. E Lackey, K Inamdar, L Worrel, W Al-Akhdar and D Wostratzky, RadTech Rep., 15(3), 36 (2001)
  124. F Vigeant and D Wostratzky, RadTech Rep., 15(3), 20(2001)
  125. T Glauser, M Johansson and A Hult, Polymer, 40, 5297(1999) https://doi.org/10.1016/S0032-3861(98)00752-6
  126. E Muh, J E Klee, H Frey and R Mulhaupt, Polym. Mater. Sci. Eng., 82(1), 99(2000)
  127. H-T Macholdt, "Proc. Ink Makers Forum 2nd Eur. Congress Printing Inks", Nuremberg, p.223, 2003
  128. D Skinner, "Proc. Paint Res. Assoc. Conf. Aspects of Photoinitiation", Egham, p.231, 1993
  129. J P Fouassier, Curr. Trends Polym. Sci., 4, 163(1999)
  130. K Dietliker, A Compilation of Photoinitiators (2002)
  131. M Koehler, M Holer, M B Aebli and E Eckstein, WO. Pat. 0129093(2001)
  132. S Megert, M Koehler, D Rogez, M Burglin and A Litzler, "Proc. Paint Res. Assoc. Conf. Radcure Coat. Inks", Harrogate, (2000)
  133. A Avalet, Prog. Org. Coat., 35, 223(1999) https://doi.org/10.1016/S0300-9440(99)00018-1
  134. R W Stowe, Proc. 16th Int. Conf. Waterborne, High Solids Radcure Technol., Frankfurt, 1996
  135. R W Stowe, "Proc. RadTech North Amer.", Indianapolis, p.613, 2002
  136. M Cattaneo, R Filpa, P Soragna, and M Visconti, "Proc. RadTech Eur.", Basle, p.539, 2001
  137. M Resinger and C Rickert, "Proc. RadTech Eur.", Basle, p.101, 2001
  138. A B Scranton, G A Miller, L Gou and M El-Maazawi, "Proc. RadTech North Amer.", Indianapolis, p.129, 2002
  139. R Bao and S Jonsson, "Proc. RadTech North Am.", Indianapolis, p.249, 2002
  140. B Cox and O Valdes-Aguilera, RadTech Rep., 13(3), 40(1999)
  141. J Owed and D Fisher, RadTech Rep., 14(6), 28(2000)
  142. P Mills, "Proc. RadTech Eur.", Basle, p.65, 2001
  143. K H Joesel, RadTech Rep., 14(6), 16(2000)
  144. P H Stenson and C H McLean, "Proc. RadTech North Amer.", Chicago, p.62, 1998
  145. E V Sitzmann, R J Brautigam, C M Srivasatava and G D Green, "Proc. RadTech North Amer.", Chicago, p.57, 1998
  146. T Yamamura, Y Kato, T Ukachi, T Tanabe and Y Chen, WO. Pat. 0049080(2000)
  147. J Jang and D S Park, J. Korean Soc. Dyers & Finishers, 17(1), 7(2005)
  148. Y K Jeong, Y J Jeong and J Jang, J. Korean Soc. Dyers & Finishers, 17(6), 27(2005)
  149. J Jang, S I Eom and Y H Kim, J. Korean Fiber Soc., 39(1), 100(2002)
  150. J Jang and D S Park, J. Korean Soc. Dyers & Finishers, 17(1), 7(2005)
  151. Y K Jeong, Y J Jeong and J Jang, J. Korean Soc. Dyers & Finishers, 17(6), 27(2005)
  152. J Jang, S I Eom and Y H Kim, J. Korean Fiber Soc., 39(1), 100(2002)
  153. J Jang, M J Kim and Y J Jeong, J. Korean Fiber Soc., 40(5), 424(2003)
  154. M J Kim, J Jang and Y J Jeong, J. Korean Fiber Soc., 41(2), 80(2004)
  155. J Jang, Fiber Technology and Industry, 7(3), 303(2003)
  156. J Jang and C. M. Carr, J . Korean Fiber Soc., 36(1), 82(1999)
  157. J Jang and C. M. Carr, J . Korean Fiber Soc., 36(2), 179(1999)