IE interfaces (산업공학)

Korean Institute of Industrial Engineers (대한산업공학회)
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Burn-in Considering a Trade-Off of Yield and Reliability

수율과 신뢰도의 상충효과를 고려한 번인

  • Received : 20061100
  • Accepted : 20070100
  • Published : 2007.03.31
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Abstract

Burn-in is an engineering method for screening out products containing reliability defects which would cause early failures in field operation. Previously, various burn-in models have been proposed mainly focused on the trade-off of shop repair cost and warranty cost ignoring manufacturing yield. From the view point of a manufacturer, however, burn-in decreases warranty cost at the expense of yield reduction. In this paper, we provide a general model quantifying a trade-off between product yield and reliability, in which any defect distribution from previous yield models can be used. A profit function is expressed in burn-in environments for determining an optimal burn-in time. Finally, the method is illustrated with gate oxide failures which is an important reliability concerns for VLSI CMOS circuits.

Keywords

References

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