References
- P. R. Griffiths, J.A. de Haseth, 'Fourier Transform Infrared Spectrometry,' John Wiley & Sons, New York 1986
- T. Hirschfeld, 'Fourier Transform Infrared Spectroscopy: Application to chemical systems,' vol.2, New York 1979
Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)
- Volume 44 Issue 4
- /
- Pages.10-17
- /
- 2007
- /
- 1229-6368(pISSN)
Analysis of sampling noise effect of Interferometer on FTIR Spectrometer
FTIR 분광용 간섭계의 샘플링 잡음 영향 분석
- Bae, Hyo-Wook (Institute for Advanced Engineering) ;
-
Park, Do-Hyun
(Institute for Advanced Engineering)
;
-
Ra, Sung-Woong
(Department of Electrical Information and Communication Eng.)
;
- Choi, Seung-Ki (Agency for Defense Development)
- Published : 2007.04.25
Abstract
FTIR(Fourier Transform Infrared) spectrometry is a useful method to obtain infrared spectra of materials in gas phase by registering the interferogram of a target material using an interferometer, and then performing a Fourier transform on the interferogram to obtain the spectrum. In this paper, sampling noise effect on signal processing of the rapid scan interferometer was studied with relation to sampling the interferogram points at the improper location and empirically verified.
FTIR 분광계는 간섭계를 사용하여 표적 물질에 대한 간섭무늬를 획득하고, 이를 푸리에 변환함으로써 기체상태 물질의 적외선 영역 스펙트럼을 획득하기 위한 유용한 기법이다. 본 논문에서는 불규칙적 위치에서 간섭무늬 샘플링에 관하여 고속 스캔 간섭계의 신호처리에서의 샘플링 노이즈 영향에 대한 연구와 이에 대하여 실험적으로 검증 하였다.