Ceramist (세라미스트)
- Volume 10 Issue 3
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- Pages.55-66
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- 2007
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- 1226-976X(pISSN)
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- 2586-0631(eISSN)
Infrared Scanning Near-Field Optical Microscopy (IR-SNOM) Below the Diffraction Limit
- Sanghera, J.S. (Naval Research Laboratory) ;
- Aggarwal, I.D. (Naval Research Laboratory) ;
- Cricenti, A. (Instituto di Stuttura delia Materia) ;
- Generossi, R. (Instituto di Stuttura delia Materia) ;
- Luce, M. (Naval Research Laboratory) ;
- Perfetti, P. (Instituto di Stuttura delia Materia) ;
- Margoritondo, G. (Institut de Physique Appliquee, Ecole Polytecnique Federale) ;
- Tolk, N. (Vanderbilt University) ;
- Piston, D. (Vanderbilt University)
- Published : 2007.06.30
Abstract
Infrared Scanning Near-field Optical Microscopy (IR-SNOM) is an extremely powerful analytical instrument since it combines IR spectroscopy's high chemical specificity with SNOM's high spatial resolution. In order to do this in the infrared, specialty chalcogenide glass fibers were fabricated and their ends tapered to generate SNOM probes. The fiber tips were installed in a modified near field microscope and both inorganic and biological samples illuminated with the tunable output from a free-electron laser located at Vanderbilt University. Both topographical and IR spectral images were simultaneously recorded with a resolution of
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