Correlation between the dielectric constant and porosity due to the nano pore in the thin film

나노기공에 의한 박막 내의 기공율과 절연상수의 상관관계

  • Oh, Teresa (School of Electronic and Information Engineering, Cheongju University)
  • Published : 2007.03.25

Abstract

SiOC films were made using the oxygen and bistrimethylsilylmethane mixed precursor. The chemical properties of SiOC films divided into three properties, organic, hybrid and inorganic depending on the flow rate ratio between oxygen and bistrimethylsilylmethane precursor. The films with organic properties decreased dielectric constant, because of pore incorporation in final materials. In this study, the porosity of SiOC films with organic properties was investigated using the Makwell-Garnett equation. The porosity of the films could be correlated with the blue shift in the infrared spectra scopy, and increased with the decreasing the dielectric constant of the film.

SiOC 박막은 산소와 bistrimethylsilylmethane 전구체를 사용하여 CVD방법을 이용하여 만들었다. 유량비에 따라서 유기물, 하이브리드 그리고 무기물 특성의 3가지 특성으로 분류되어지는데 유기물의 특성을 지니는 박막에서 기공이 생성되었다 기공의 생성은 유전상수가 낮아지는 효과가 있으며, 본 연구에서는 기공이 형성되는 유기물 특성의 SiOC 박막내의 기공율을 Maxwell-Garnett 등식을 이용하여 계산하였다. 박막의 기공율은 IR분포에서 blue shift특성을 가지며, 기공율이 증가할수록 유전상수는 감소하였다.

Keywords

References

  1. M. A. Tamor, C. H. Wu, R. O Carter and N. E. Lindsay, 'Pendant benzene in hydrogenated diamond-link carbon,' Appl. Phys. Lett. vol. 55, no. 14, pp. 1388-1390, 1999
  2. H. J. Kim, Q. Shao and Y. H. Kim, 'Characterizaion of low-dielectric-constant SiOC thin films deposited by PECVD for interlayer dielectrics of multilevel interconnection,' Surface and Coatings Technology, vol. 171, pp. 39-45, 2003 https://doi.org/10.1016/S0257-8972(03)00233-0
  3. P. Masri, 'Silicon carbide and silicon carbide -based structures,' The physics of epitaxy, Surface science reports, vol. 48, pp. 1-5, 2002 https://doi.org/10.1016/S0167-5729(02)00099-7
  4. A. Grill and D. A. Neumayer, 'Structure of low dielectric constant to extreme low dielectric constant SIOCH films: Fourier transform infrared spectroscopy characterization,' J. Appl. Phys. vol. 94, pp. 6697-6707, 2003 https://doi.org/10.1063/1.1618358
  5. K. S. OH, S. Y. JING, C. K. Choi, K. M. Lee and H. J. Lee, 'Formation and caracteristic of fluorinated amorphous carbon films deposited by CF4/CH4 ICPCVD,' Journal of the Korean Physical Society, vol. 39, no. 2, pp. 291-295, 2001
  6. G. Galli and R. M. Martin, 'Structural and electronic properties of amorphous carbon,' Phys. Rev. Lett. vol. 62, no. 5, pp. 555-558, 1999 https://doi.org/10.1103/PhysRevLett.62.555
  7. T. Oh, K. M. Lee, S. T. Ko, K. S. Kim, K. J. Ahn and C. K. Choi, ' Bonding Structure of the Cross-link in Organosilicate Films Using O2/BTMSM Precursors,' Jpn. J. Appl. Phys. vol. 42, pp.1517-1520, 2003 https://doi.org/10.1143/JJAP.42.1517
  8. T. Oh, H. S. Kim, S. B. Oh and M. S. Won, 'The Chemical Shift According To The flow Rate Ratio O2/BTMSM by FTIR and XPS,' Jpn. J. Appl. Phys. vol. 42, pp. 6292-6295, 2003 https://doi.org/10.1143/JJAP.42.6292
  9. 오데레사 '탄소밀도의 변화가 SiOC 박막의 결합 구조에 미치는 영향,' 대한전자공학회, vol. 43, pp. 322-327, May. 2006
  10. J. H. Yun, E. S. Choi, C. M. Jang and C. S. Lee, 'Effect of post-treatments on atomic layer deposition of TiN thin films using tetrakis (dimethylamido) titanium and ammonia,' Jpn. J. Appl. Phys. vol. 41, pp. L418-L421, 2002 https://doi.org/10.1143/JJAP.41.L418