References

1. Kim, J. H., 'A Detection Method of Non-uniform Brightness Defects in LCD Based on Human Vision,' The Institute of Electronics Engineering of Korea-SP, Vol. 41, No. 3, pp. 9-16, 2004
2. Ko, M. S., Kim, W. S., Song, Y C., Choi, D. H. and Park, K. H., 'Image Reconstruction Using Line-scan Image for LCD Surface Inspection,' The Institute of Electronics Engineering of Korea-SP, Vol. 41, No.4, pp. 497- 502, 2004
3. Oh, J. H., Kwak, D. M., Lee, K. B., Song, Y. C., Choi, D. H. and Park, K. H., 'Line Defect Detection in TftLed Using Directional Filter Bank and Adaptive Multilevel Thresholding,' Key Engineering Materials, Vol. 270-273, pp. 233-238, 2004
4. Kim, W. S., Kwak, D. M., Song, T. C., Choi, D. H. and Park, K. H., 'Detection of Spot-Type Defects on Liquid Crystal Display Modules,' Key Engineering Materials, Vol. 270-273 pp. 808-813, 2004
5. Yoda, H., Ohuchi, Y, Taniguchi, Y and Ejiri, M., 'An automatic wafer inspection system using pipe lined image processing techniques,' IEEE, T-PAMI, Vol. 10, Issue 1, pp 4-15, 1988 https://doi.org/10.1109/34.3863
6. Parker, J. R., 'Practical Computer Vision,' AddisonWesley, pp. 100-154, 1992
7. Timothy, S., 'Newman A survey of automated visual inspection,' Computer vision and image understanding, Vol. 61, No.2, pp. 231-262, 1995 https://doi.org/10.1006/cviu.1995.1017